Samsung Electronics Co., Ltd.

Samsung Display Co., Ltd.

Won-Chul Lee

Dongjin Park

Jung Suk Bang

You Young Jin

Jingyu Sim

Jonghyeon Choi

Myoung-Won Yoon

KwangSun You

Byoungjin Jin

Sang Ii Kim

JungGil Oh

Ik-Sang Lee

Eun-Kyoung Kim

Jong-Chul Lee

Oh-Suk Kwong

Ji-Suk Park

Eung-Youl Kang

A display device includes a backlight unit and a display panel. The backlight unit includes a bottom chassis that includes a fixing surface curved to have a shape that corresponds to a graph of a sine function, a light guide member that includes a light exit surface curved to have a shape that corresponds to the fixing surface, and a light source that provides light to the light guide member. The display panel includes a display surface curved to have a shape that corresponds to the light exit surface.

Display device

A liquid crystal panel (LCD) may include: a flexible liquid crystal panel; and a housing unit for housing the liquid crystal panel. The housing unit may have an integrated structure which includes a bottom surface, a side surface connected from the bottom surface, and a top fixing end connected from the side surface, the liquid crystal panel may be housed between the bottom surface and the top fixing end, and the housing unit may be formed of a flexible soft material.

Liquid crystal display

A display apparatus includes a display panel displaying an image, a mold frame disposed under the display panel to support the display panel and a lower receiving container receiving the display panel and the mold frame and having an opening portion, a bottom portion having a chamfered portion that at least one of a corner of the opening portion is chamfered, a side wall extended from the bottom portion to an upper direction and an engaging portion extended from the side wall to be protruded to an outside direction.

Display apparatus

A method of storing data in a nonvolatile memory device comprises performing a program operation on target memory cells among multiple memory cells, performing a first verify operation to determine whether the target memory cells are in a program pass state or a program fail state, and as a consequence of determining that the target memory cells are in the program pass state, performing a second verify operation to determine whether the target memory cells exhibit a program error symptom.

Method of storing data in nonvolatile memory device and method of testing nonvolatile memory device

A semiconductor device having a moisture-proof dam and a method of fabricating the same are provided. The semiconductor device includes an interlayer insulating layer provided on a substrate having a fuse region. A fuse guard dam is provided on the interlayer insulating layer to surround the fuse region. A cover insulating layer is provided on the interlayer insulating layer to cover the fuse guard dam and have a fuse window exposing a middle part of the fuse region, and at least two upper extension dams are provided in the cover insulating layer to sequentially surround the fuse region and be connected to the fuse guard dam.

Semiconductor device having moisture-proof dam and method of fabricating the same

In one embodiment a fuse region includes an insulating layer disposed on a substrate, a fuse disposed on the insulating layer and including a fuse barrier pattern and a fuse conductive pattern, which are stacked, and a supporting plug disposed beneath the fuse, and penetrating the insulating layer and the fuse barrier pattern.

Fuse region and method of fabricating the same

Growing community of inventors

Seoul, South Korea

Won-Chul Lee