Analytik Jena Gmbh+co. Kg

Analytik Jena Gmbh

Wolfram Weisheit

Iouri Kalinitchenko

Roland Lehmann

Marcus Großmann

Philipp Frederic Schulz

A method for analyzing a sample using a system, wherein the sample is a solid sample comprising a first chemical element and a second chemical element, wherein the system comprises a plasma spectrometer and an analytical device, the method including: determining a concentration of the first chemical element using the analytical device; determining a sensitivity of the plasma spectrometer to the first chemical element and to the second chemical element; measuring a signal intensity of the first chemical element using the plasma spectrometer; measuring a signal intensity of the second chemical element using the plasma spectrometer; and calculating a concentration of the second chemical element using the determined concentration of the first chemical element, the sensitivities to the first chemical element and to the second chemical element, and the signal intensities of the first chemical element and the second chemical element.

System for analyzing a sample

A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.

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Wolfram Weisheit