Growing community of inventors

Dresden, Germany

Wolfram Drescher

Average Co-Inventor Count = 1.91

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 32

Wolfram DrescherJan Richter (12 patents)Wolfram DrescherChristian Beyer (7 patents)Wolfram DrescherLukas Lichtensteiger (5 patents)Wolfram DrescherMarko Swoboda (2 patents)Wolfram DrescherRalf Rieske (2 patents)Wolfram DrescherFranz Schilling (2 patents)Wolfram DrescherUwe Porst (2 patents)Wolfram DrescherVolker Aue (1 patent)Wolfram DrescherGerhard P Fettweis (1 patent)Wolfram DrescherWolfram Drescher (25 patents)Jan RichterJan Richter (38 patents)Christian BeyerChristian Beyer (31 patents)Lukas LichtensteigerLukas Lichtensteiger (8 patents)Marko SwobodaMarko Swoboda (24 patents)Ralf RieskeRalf Rieske (18 patents)Franz SchillingFranz Schilling (7 patents)Uwe PorstUwe Porst (5 patents)Volker AueVolker Aue (34 patents)Gerhard P FettweisGerhard P Fettweis (24 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Siltectra Gmbh (15 from 44 patents)

2. Nxp B.v. (6 from 5,113 patents)

3. Systemonic Ag (3 from 7 patents)

4. Other (1 from 832,680 patents)


25 patents:

1. 12211702 - Solid body and multi-component arrangement

2. 11699616 - Method for producing a layer of solid material

3. 11518066 - Method of treating a solid layer bonded to a carrier substrate

4. 11201081 - Method for separating thin layers of solid material from a solid body

5. 11004723 - Wafer production method

6. 10978311 - Method for thinning solid body layers provided with components

7. 10843380 - Method for the material-saving production of wafers and processing of wafers

8. 10825732 - Method of producing stresses in a semiconductor wafer

9. 10593590 - Combined wafer production method with laser treatment and temperature-induced stresses

10. 10580699 - Method and device for the production of wafers with a pre-defined break initiation point

11. 10312135 - Combined wafer production method with laser treatment and temperature-induced stresses

12. 10304738 - Method and device for the production of wafers with a pre-defined break initiation point

13. 10269643 - Method and device for the production of wafers with a pre-defined break initiation point

14. 10229835 - Splitting method and use of a material in a splitting method

15. 10141219 - Combined production method for separating a number of thin layers of solid material from a thick solid body

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as of
12/4/2025
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