Rohde and Schwarz Gmbh & Co. Kg

Wolfgang Wendler

Alexander Roth

Florian Ramian

Gregor Feldhaus

Hagen Eckert

Florian Lang

Martin Weiss

Matthias Keller

A detector circuit for a measurement instrument is described. The detector circuit includes a first signal input, a second signal input, and an averaging sub-circuit. The first signal input is configured to receive a first complex-valued measurement signal associated with an input signal received from a device under test. The second signal input is configured to receive a second complex-valued measurement signal associated with the input signal received from the device under test. The averaging sub-circuit is configured to determine an average of the first complex-valued measurement signal and of a complex conjugate of the second complex-valued measurement signal over a predetermined number of samples, thereby obtaining a complex-valued average signal. The averaging sub-circuit is configured to generate an output signal based on the complex-valued average signal. Further, a signal processing circuit and a measurement instrument are described.

Detector circuit, signal processing circuit, and measurement instrument

A signal processing circuit for a measurement instrument is described. The signal processing circuit includes an analysis circuit, a measurement input, and at least two parallel measurement channels. The parallel measurement channels are configured to process the input signal, thereby generating first and second complex-valued measurement signals. The analysis circuit is configured to determine first and second error quantities associated with the first and second complex-valued measurement signals, respectively. The analysis circuit is configured to determine a complex-valued average signal corresponding to a combined average of the first and second complex-valued measurement signals. The analysis circuit is configured to determine a combined error quantity based on the complex-valued average signal. The analysis circuit is configured to determine a comparison quantity based on the combined error quantity as well as based on the first error quantity and/or the second error quantity.

Signal processing circuit and measurement instrument

The invention relates to a measuring device and a measurement method for the display of a measurement signal connected to the measuring device. The measuring device comprises a measurement-signal input, a measurement-parameter input, a calculation unit and a display unit for the display of calculated statistical signals. The measuring device is set up to display a plurality of statistical signals in parallel on the display unit in real-time.

Measuring device and measuring method with multiple display

Recording of a control command sequence related to multiple devices. Each of the multiple devices may receive user input by a user inter-face, and the received user input may be converted to appropriate control commands. Timestamp information is assigned to each control command, and the control commands of the multiple devices are merged together to a common control command sequence based on the assigned timestamp information.

Command recording arrangement and command recording method

A measuring system comprises a noise source adapted to provide a noise signal to a device under test. Moreover, it comprises a measuring device adapt to measure a measuring signal generated by the device under test in reaction to the noise signal. The measuring device further comprises a signal splitter adapted to split the measuring signal into at least a first split measuring signal and a second split measuring signal. Moreover it comprises a correlator adapted to correlate a signal derived from the first split measuring signal and a signal derived from the second split measuring signal. Also the measuring device comprises a processor adapted to determine an amplification factor and/or a noise figure of the device under test based upon the correlated signal derived from the first split measuring signal and signal derived from the second split measuring signal.

Measuring system and measuring method for measuring amplification and noise by correlation

A device for measuring the phase-noise spectrum of a pulsed sinusoidal signal generates a pulsed sinusoidal signal, converts the analog pulsed sinusoidal signal into a corresponding digital, pulsed sinusoidal signal and mixes the digital, pulsed sinusoidal signal into the baseband by means of quadrature mixing. Following this, the phase of the pulsed sinusoidal signal in the baseband is determined by means of Fourier transform of the phase of the pulsed sinusoidal signal, the phase spectrum of the pulsed sinusoidal signal is determined, and the phase-noise spectrum of the pulsed sinusoidal signal is determined by removing the spectral lines associated with the sinusoidal signal from the phase spectrum. According to the invention, the pulse pauses are removed from the pulsed sinusoidal signal in the baseband.

Method and device for measuring the phase-noise spectrum of a pulsed sinusoidal signal

A method and a device for measuring the phase noise of a signal registers the measurement signal (V) with a given measurement frequency (f) and with a superimposed phase noise (f(t)), divides the measurement signal (V) into a first and second measurement signal (V', V&#x2032;), derives a first signal (V) with a first frequency ((f+f(t))/N) reduced relative to the measurement frequency (f) and the superimposed phase noise (f(t)) and a second signal (V) with a second frequency ((f+f(t))/M) reduced relative to the measurement frequency (f) and the superimposed phase noise (f(t)), determines a third signal (V) with a third frequency (f(t)) compensated by the measurement frequency (f) relative to the first frequency ((f+f(t))/N) of the first signal (V) and a fourth signal (V) with a fourth frequency (f(t)) compensated by the measurement frequency (f) relative to the second frequency ((f+f(t))/M) of the second signal (V) and determines a correlation spectrum from the third and fourth signal (V, V). The frequencies of the third and fourth signal (V, V) come to be disposed in each case within the frequency range of the correlation spectrum as a result of the frequency division of the frequency (f+f(t)) of the first and second measurement signal (V&#x2032;, V&#x2032;).

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Groebenzell, Germany

Wolfgang Wendler