International Business Machines Corporation

Wolfgang Mayr

Keith E Fogel

Voya Rista Markovich

Brian Samuel Beaman

Mark Vincent Pierson

Jane M Shaw

George Frederick Walker

Bahgat Ghaleb Sammakia

Anthony P Ingraham

Jungihl Kim

Morris Anschel

Michael D Lowell

Scott D Reynolds

Timothy Shawn Reny

Richard Gerald Murphy

Wayne R Storr

Charles Robert Lamb

Tamar A Powers

A method of testing semi-conductor chips is disclosed. The individual semiconductor chips have I/O, power, and ground contacts. In the method of the invention a chip test fixture system is provided. The chip test fixture system has contacts corresponding to the contacts on the semiconductor chip. The carrier contacts have dendritic surfaces. The chip contacts are brought into electrically conductive contact with the conductor pads on the chip test fixture system. Test signal input vectors are applied to the inputs of the semiconductor chip, and output signal vectors are recovered from the semiconductor chip. After testing the chip is removed from the substrate.

Method and apparatus for testing of integrated circuit chips

An electrical connector is described for making contact with a plurality of convex and deformable contacts on an electronic device. The electrical connector comprises a substrate having a plurality of conductors which extend above its surface. A polymeric material is disposed on the surface of the substrate and has openings which expose the conductors, each opening sized to receive one of the convex, deformable contacts, and to enable electrical connection between the exposed conductors and the deformable contacts. A mechanism is provided for urging the deformable contacts on the electronic device against the exposed conductors. The mechanism exerts sufficient force between the device and the conductors to cause some deformation of the convex contact areas by the conductors.

Connector assembly for chip testing

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Poughkeepsie, NY, United States of America

Wolfgang Mayr