Basf Aktiengesellschaft

Boehringer Mannheim Gmbh

Roche Diagnostics Gmbh

Knoll, Wolfgang

Wolfgang Knoll

Werner Hickel

Peter Sluka

Christian Klein

Ulrike Licht

Rupert Herrmann

Helmut Ringsdorf

Harald Fuchs

Dirk Funhoff

Gerhard Wegner

Wolfgang Schrepp

Hans-Joachim Guder

Gisela Duda

Thorstein Liebermann

Harald Knobloch

Franz-Josef Schmitt

Martha Liley

Jurgen Spinke

Renate Naumann

Dierk Beyer

Stefan Schiller

Manfred Zizlsperger

Benno Rothenhaeusler

A process is described for applying spatially defined reagent areas to a solid phase which is characterized in that a liquid containing an adsorptive binding reagent is contacted with spatially defined areas of a solid phase which comprises an essentially continuous metal or metal oxide surface for an adequate time period to enable the formation of adsorptive bonds between the binding reagent and the solid phase.

Process for the application of reagent spots

A method for the detection of an analyte is described which is characterized in that the binding of the analyte to a solid phase is determined by the independent analysis of the signals from a plasmon resonance measurement and a fluorescence measurement.

Method for the simultaneous determination of biomolecular interactions by means of plasmon resonance and fluoresence detection

A surface coated with amino groups is produced by applying a polymerizable amine to a surface by means of a pulsed plasma. The coated surfaces obtained thereby have a high density of amino groups so that a specific binding phase can be obtained by covalently binding a partner of a specific binding pair to the surfaces coated with amino groups.

Process for producing a surface coated with amino groups

The invention concerns a binding matrix containing a carrier material and a solid phase reactant which is adsorbed to this via anchor groups that is capable of binding to at least one free reaction partner wherein the solid phase reactant forms a dilute and essentially laterally homogeneous binding layer on the surface of the carrier material. In addition a method for the determination of an analyte in a sample solution is claimed in which a solid phase reactant is used which is a component of a binding matrix according to the present invention. In this process the specific binding reaction is preferably determined by optical reflection techniques.

Universal binding film

A device for the laterally resolved investigation of a laterally heterogeneous ultrathin object layer, especially for the laterally resolved detection of a change in the layer thickness of the object layer which results from a specific binding reaction of a first binding partner bound to the object layer with an unbound second binding partner. The device has a multilayer structure which extends in an investigation region and includes the object layer as first layer and a second layer adjacent to the latter, a coupler arrangement for the coupling in of excitation light into the second layer. The excitation light generates at at least one defined angle of incidence in the second layer a bound, non-radiating electromagnetic wave, from which an evanescent wave extends into the object layer. An optical imaging system is provided for the imaging of the investigation region of the object layer in an image plane at a defined angle of emergence, at which detection light is coupled out from the second layer. The coupler arrangement includes an optical grating structure which extends in the investigation region parallel to the object layer and which is rotatable about an axis extending perpendicular to the grating plane. This allows adjustment of the image contrast, by varying the orientation of the grating lines relative to the plane of incidence.

Device for the laterally resolved investigation of a laterally

The refractive index and thickness of ultrathin layers&lt;1 .mu.m in thickness are determined by recording the layers, which have been applied to a solid support, by surface plasmon microscopy as a function of the angle of incidence of the incident laser beam, the method making it possible to determine layer thicknesses with a vertical resolution.gtoreq.0.1 nm and a simultaneous lateral resolution.gtoreq.5 .mu.m.

Determination of refractive index and thickness of thin layers

The physical properties of thin films can be examined with the aid of polarized light with which the film to be examined is irradiated while the reflected or transmitted light is deflected in the direction of an imaging system, the polarized light having the effect of exciting waveguide modes in the film to be examined.

Examination of the physical properties of thin films

The physical properties of thin films can be examined with polarized light using a method which comprises directing polarized light at a layer system, exciting plasmon surface polaritons therein and thereby creating Raman-scattered light within the layer or layer system under examination, and imaging said light on a detector using an imaging system.

Examination of physical properties of thin films

Information stored in a thin polymer layer is read out in a process wherein information introduced into a thin polymer layer on a metallic or semiconductor layer by electromagnetic or particle rays which produce a permanent change in the properties of the polymer layer in the irradiated areas is read out using surface plasmons.

Reading out information stored in thin polymer layers

A technique for examining surface structures which differ in respect of refractive index and/or height modulation of the surface comprises introducing these surface structures into a plasmon surface polariton field and scanning them by means of surface plasmon microscopy.

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Mainz, Germany

Wolfgang Knoll