Growing community of inventors

Munich, Germany

Wolfgang Ernst

Average Co-Inventor Count = 5.87

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 84

Wolfgang ErnstGunnar H Krause (12 patents)Wolfgang ErnstJustus Kuhn (12 patents)Wolfgang ErnstMichael Schittenhelm (12 patents)Wolfgang ErnstJens Lüpke (6 patents)Wolfgang ErnstJochen Mueller (5 patents)Wolfgang ErnstJochen Müller (5 patents)Wolfgang ErnstPeter Pöchmüller (5 patents)Wolfgang ErnstJens Luepke (4 patents)Wolfgang ErnstPeter Poechmueller (3 patents)Wolfgang ErnstPeter Pöchmüller (2 patents)Wolfgang ErnstJochen Müller (2 patents)Wolfgang ErnstJens Lüpke (2 patents)Wolfgang ErnstPeter Poechmüller (2 patents)Wolfgang ErnstNorbert Lang (1 patent)Wolfgang ErnstWolfgang Ernst (13 patents)Gunnar H KrauseGunnar H Krause (30 patents)Justus KuhnJustus Kuhn (19 patents)Michael SchittenhelmMichael Schittenhelm (16 patents)Jens LüpkeJens Lüpke (6 patents)Jochen MuellerJochen Mueller (9 patents)Jochen MüllerJochen Müller (9 patents)Peter PöchmüllerPeter Pöchmüller (7 patents)Jens LuepkeJens Luepke (5 patents)Peter PoechmuellerPeter Poechmueller (29 patents)Peter PöchmüllerPeter Pöchmüller (22 patents)Jochen MüllerJochen Müller (11 patents)Jens LüpkeJens Lüpke (6 patents)Peter PoechmüllerPeter Poechmüller (2 patents)Norbert LangNorbert Lang (9 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Infineon Technologies Ag (11 from 14,724 patents)

2. Other (2 from 832,843 patents)


13 patents:

1. 7117403 - Method and device for generating digital signal patterns

2. 7117404 - Test circuit for testing a synchronous memory circuit

3. 7062690 - System for testing fast synchronous digital circuits, particularly semiconductor memory chips

4. 6957373 - Address generator for generating addresses for testing a circuit

5. 6871306 - Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested

6. 6865707 - Test data generator

7. 6862702 - Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices

8. 6839397 - Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits

9. 6744272 - Test circuit

10. 6721904 - System for testing fast integrated digital circuits, in particular semiconductor memory modules

11. 6618305 - Test circuit for testing a circuit

12. 6556492 - System for testing fast synchronous semiconductor circuits

13. 5214231 - Apparatus for electronic teaching accompaniment and practice of music,

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as of
12/27/2025
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