Rohde and Schwarz Gmbh & Co. Kg

Wolfgang Dressel

Alexander Roth

Florian Ramian

The present disclosure relates to a method for testing a device under test by using a test system. The method comprises the steps of: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a test and measurement instrument; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

Method as well as test system for testing a device under test

An external frontend device is described. The external frontend device includes an integrated synthesizer circuit, a reference signal input, a receiver channel, a transmitter channel, and at least one mixer circuit. The reference signal input is configured to receive a low-frequency reference signal. The reference signal input is configured to forward the received low-frequency reference signal to the integrated synthesizer circuit. The integrated synthesizer circuit is configured to generate a local oscillator (LO) signal based on the low-frequency reference signal. The at least one mixer circuit is associated with the receiver channel and/or with the transmitter channel. The at least one mixer circuit is configured to mix the LO signal with a radio frequency (RF) signal processed by the receiver channel and/or with an intermediate frequency (IF) signal processed by the transmitter channel, thereby obtaining an IF output signal and/or an RF output signal, respectively. Further, a frontend system is described.

External frontend device and frontend system

A method for testing a device under test by using a test system is disclosed. The method comprises: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a vector signal analyzer; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

Growing community of inventors

Munich, Germany

Wolfgang Dressel