Carl Zeiss Microscopy Gmbh

Carl Zeiss Microimaging Gmbh

Carl Zeiss Jena Gmbh

Wolfgang Bathe

Ralf Netz

Joerg Steinert

Ralf Wolleschensky

Michael Goelles

Stanislav Kalinin

Thomas Kalkbrenner

Hans-Juergen Dobschal

Helmut Lippert

Matthias Wald

Ingo Fahlbusch

Mirko Liedtke

Dieter Huhse

Werner Kleinschmidt

Thomas Egloff

Robert Hauschild

Michael Brehm

Jörg Steinert

Volodymyr Kudryavtsev

Benedikt Lübbers

Jorg Engel

Jörg Engel

The invention relates to a method for reducing image artifacts in images of a sample captured by scanning, wherein intensity values of at least two detection regions, denoted as pixels (Px), are captured along respectively one row (j) in a first scanning direction. A reconstructed image is produced on the basis of the captured intensity values. According to the invention, the intensity values of the reconstructed image are summed along the rows (j) respectively scanned by a certain pixel (Px) and a row sum is formed in each case. A correction value of the pixel (Px) is ascertained on the basis of the row sums formed thus and the correction value is applied to the intensity values, captured by means of the pixel (Px), of the reconstructed image, as a result of which a corrected image is obtained.

Method for reducing image artifacts

A method for the high-resolution scanning microscopy of a specimen where the specimen is illuminated with illuminating radiation such that the illuminating radiation is focused to a diffraction-limited illuminating spot at a point in or on the specimen. The point is projected in a diffraction-limited manner in a diffraction image onto a flat panel detector having pixels. The flat panel detector, owing to the pixels thereof, have a spatial resolution which resolves a diffraction structure of the diffraction image. The point is shifted relative to the specimen into different scanning positions by an increment which is smaller than the diameter of the illuminating spot and a 3D image is generated. The pixels of the flat panel detector are divided into groups. A pre-calculated raw image is calculated for each group and are unfolded three-dimensionally to generate the image of the specimen.

High-resolution confocal microscope

In a method for high-resolution scanning microscopy of a sample, provision is made of focusing of illumination radiation into an illumination spot in or on the sample and stimulating the emission of detection radiation at a sample spot that coincides with the illumination spot. The sample spot is imaged into an image that is static on a spatially resolving surface detector having pixels of a size that spatially resolve the image, wherein the imaging has a an optical imaging resolution limit. The entire sample is captured by performing a scanning movement of the illumination spot and of the coinciding sample spot over the sample in a scanning operation. An image of the sample having a resolution that is increased beyond the optical imaging resolution limit of the imaging is produced from the data of the pixels for each scanning position.

Method for accelerated high-resolution scanning microscopy

The invention relates to a multi-color scanning microscope comprising at least one first light source for emitting a first excitation beam comprising first excitation light having a first wavelength and a second light source for emitting a second excitation beam comprising second excitation light having a second wavelength, which differs from the first wavelength, comprising coupling-in means for coupling the first excitation beam and/or the second excitation beam into an excitation beam path, comprising optical means for guiding the first excitation beam and the second excitation beam to a sample and for guiding detection light emitted by the sample in a detection beam path to a detection unit, wherein the optical means comprise at least the following components: at least one first main color splitter for separating the first excitation light and/or the second excitation light, on the one hand, from the detection light emitted by the sample, on the other hand, a scanner for scanning the sample with at least the first excitation light and the second excitation light, a microscope objective for focusing the first excitation light and the second excitation light onto or into the sample and for guiding the detection light emitted by the sample in the direction of the detection unit, and comprising the detector unit for detecting the detection light emitted by the sample. The microscope is characterized in that the coupling-in means and at least parts of the optical means are designed and arranged in such a way that the first excitation beam having the first wavelength is guided onto a first sample location and the second excitation beam having the second wavelength is guided onto a second sample location, which differs from the first sample location, and in that the detector unit comprises a first detector for detecting the light emitted by the first sample location and a second detector for detecting the light emitted by the second sample location.

Multi-color scanning microscope

An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement.

Light microscope and microscopy method

The invention relates to a method for high-resolution luminescence microscopy of a specimen marked with marker molecules, and to a luminescence microscope for performing the method, wherein the marker molecules can be excited to emit luminescence radiation. The method for luminescence microscopy comprises the excitation and imaging of marker molecules and the transmission of a trigger time and a position of the specimen. An optical recording device images the marker molecules in a capture area and transmits data from the imaging to an image capture circuit. The recording device transmits a time for the imaging to a signal former as a trigger time; the trigger time is then transmitted to a data recorder. The data recorder generates a position of the specimen at the trigger time and transmits said position to the image capture circuit, which links the position of the specimen in the depth direction to the data of the imaging of a frame such that a three-dimensional tomographic image of the specimen can be created.

Luminescence microscopy

A light microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement. Sample light can be imaged in a non-inverting manner and with an imaging scale of less than one. The invention is additionally directed to a corresponding microscopy method.

A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

Microscope having light sheet illumination of a sample region

To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.

Detector arrangement having increased sensitivity

A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

Calibration device and laser scanning microscope with such a calibration device

A spectral analytical unit for acting on a parallel light bundle having different wavelengths. The spectral analytical unit includes a diffraction grating on which the light bundle falls, the diffraction grating splitting the different wavelengths through diffraction in first spectral directions defining a light bundle diffraction order 1 without recycle, and the diffraction grating bending the light bundle in second directions defining a light bundle diffraction order 0 without recycle, a detector line made up of a plurality of elements, optics for focusing the split light bundle diffraction order 1 without recycle on the detector line, evaluation electronics connected to the detector line for obtaining data related to a created spectrum, and a deflecting device wherein the diffraction order 0 light bundle without recycle meets on the deflecting device which is so directed and positioned that this light bundle falls on the diffraction grating thereby creating a reflected diffraction order 1 light bundle with first recycle and a reflected diffraction order 0 light bundle with first recycle whereby the diffraction order 1 without recycle and the reflected diffraction order 1 light bundle with first recycle each of a part wavelength range are impressed through the optics on a single element of the detector line.

Spectral analysis unit with a diffraction grating

Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.

Laser scanning microscope

A climatic cabinet for receiving objects, preferably microtiter plates, which contains a preferably rotatable object receptacle in the interior. The object receptacle is vertically adjustable for changing its position relative to an input and output door. The object receptacle is adjustable in a raised position with respect to its position relative to the input and output door.

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Jena, Germany

Wolfgang Bathe