Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V.

Wladimir Tschekalinskij

Norbert Weber

Jens-Uwe Garbas

Stephan Junger

Juergen Ernst

Nanko Verwaal

Thorsten Graunke

Stephen Junger

The present invention relates to an optical filter with nanostructured layers and spectral sensors with layers of such kind. The optical filter has at least two nanostructured layers, each of which forms a transmission grating from grating wires extending parallel to each other. The grating wires of the two transmission gratings intersect each other and are positioned one on top of the other in the optical filter. An optical polarise which polarises incident optical radiation linearly parallel to the grating wires of one of the two transmission gratings is arranged over the transmission gratings. The optical filter can be produced as a bandpass filter with standard semiconductor processes without additional layers or modification of said processes.

Optical filter with nanostructured layers and spectral sensor having layers of such kind

The present invention relates to a color sensor having at least one photosensitive element, in front of which a layer stack of dielectric layers and structured metal layers is constructed, and at least one color filter, through which optical radiation incident on a light input side of the color sensor is filtered before it reaches a photosensitive surface of the photosensitive element. In the suggested color sensor, an array of angle-selective passageways is provided for the optical radiation between the light input side and the photosensitive surface, and each passageway only allows parts of the optical radiation incident on the light input side of the color sensor within a limited angle of incidence range relative to an axis extending perpendicularly to the colour filter to pass through to the photosensitive surface. When the color sensor is manufactured with semiconductor technology, it enables the angle-selective structures to be integrated in the CMOS layer stack. In this way, ultra-flat color sensors can be made.

Colour sensor with angle-selective structures

The fiber direction of a carbon fiber material of a test object is detected by means of the polarization direction of light reflected by the test object. If, for example, non-polarized light impinges upon carbon fibers, light reflected by the fibers is polarized in fiber direction.

Measurement of a fiber direction of a carbon fiber material and fabrication of an object in carbon fiber composite technique

The present invention relates to an optical bandpass filter system that has at least one combination of a bandpass filter that provides a first nanostructured metallic layer () and a bandstop filter comprising a second nanostructured metallic layer (), which are arranged one behind the other, and the layer thicknesses of which are different. The bandstop filter is tuned to the bandpass filter in such a way that it blocks a contiguous wavelength range that partially overlaps a pass-band width of the bandpass filter. With the suggested optical filter system it is possible to create various filter characteristics side by side in a small space with a small pass-band width.

Optical bandpass filter system, in particular for multichannel spectral-selective measurements

A microscope with sub-wavelength resolution with a light source for monochromatic light with a predetermined wavelength, an object carrier for an object to be examined, and an image sensor with an optical structure with a first side and a second side opposite to the first side, the optical structure having a negative refractive index, and a pixel array extending along the second side of the optical structure at a predetermined distance, wherein the first side of the optical structure of the image sensor is arranged at a near-field distance smaller than the wavelength of the monochromatic light to the object carrier.

Growing community of inventors

Nuremberg, Germany

Wladimir Tschekalinskij