Micron Technology Incorporated

William Yu

Danilo Caraccio

Daniele Balluchi

Joemar Sinipete

Jacob S Robertson

Thomas T Tangelder

James G Steele

Chad B Erickson

Methods, systems, and devices related to built-in self-test (BIST) circuitry of a controller. The controller can be coupled to multiple memory devices. The BIST circuitry can include registers configured to store burst patterns. The BIST circuitry can perform a BIST operation on the memory devices contemporaneously and using the number of burst patterns.

Built-in self-test circuitry

Methods, systems, and devices related to built-in self-test burst patterns based on architecture of memory. A controller can be coupled to a memory device. The controller can include built-in self-test (BIST) circuitry. The BIST circuitry can include registers configured to store respective write burst patterns and read burst patterns based on an architecture of the memory device.

Built-in self-test burst patterns based on architecture of memory

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Boise, ID, United States of America

William Yu