Aries Electronics, Inc.

William Y Sinclair

James P Walter

Joseph Argila

Edward A Kurz

David J Crimmins

Rocco F Basile

Steven Miller

An electrical test probe for a connector assembly includes an elongated contact, an elongated helical coil spring, and an elongated, electrically conductive tubular member disposed about the assembly of said elongated contact and elongated helical coil spring. The bottom portion of the tubular member includes a bullet-nosed portion which protects the spring and the contact during assembly of the electrical test probe in the connector assembly.

Test probe with hollow tubular contact with bullet-nosed configuration at one end and crimped configuration on other end

A top loaded burn-in socket for forming a plurality of electrical connections between a ball gird array (BGA) package having a plurality of conductive ball leads and an electrical component is provided. The socket assembly includes a plurality of resilient electrical contacts; a cam being configured to position the contacts from a first position to a second position; a device guide plate including a plurality of openings for receiving the ball leads; and an actuating mechanism configured to interact with the cam to position the contacts, wherein an upper portion of the contacts engages the ball leads between the upper portion and an inclined surface of the device guide plate openings. Each ball is thus held in a manner that does not require the use of a hold down mechanism for effecting electrical continuity between the BGA package and the contacts of the subject burn-in socket.

Top loaded burn-in socket

A shielded semiconductor chip carrier having a high-density external interface includes conventional printed circuit boards having plated through holes for achieving shielding of the contacts of the matrix. Two fork type connectors have molded about the distal ends thereof an annular ring of dielectric plastic material, and fork type connectors are press fit into each plated through hole, thereby locking the electrical contact within the shield formed by the plated through hole. The resulting connector provides a high-density contact matrix with each connector being electrically shielded along substantially its entire length.

Shielded semiconductor chip carrier having a high-density external interface

A test probe consists of an elongated screw machine contact biased by a helical spring and mounted in a through hole of a non-conductive substrate. One end of the contact includes a crown for engaging a solder ball lead of an IC package, and the contact includes an intermediate collar which maintains the contact within the through hole. The helical spring is disposed about the contact, with one end thereof engaging the lower end of the collar. The other end of the helical spring has contiguous coils and is of a reduced diameter so as to extend beyond the lower end of the non-conductive substrate to make electrical contact with a printed circuit board. When the test probe is compressed between the IC package and the printed circuit board, the inherent twisting of the helical spring causes the contact to tilt and make electrical contact with the contiguous coils, thereby establishing a direct electrical path between the IC package and the printed circuit board, with minimum resistance and minimum inductance. In an alternate embodiment, each probe is disposed within a dielectric housing which, in turn, is disposed in a through hole in a conductive substrate to effectively shield the probe from electrical interference.

Shielded integrated circuit probe

A test probe consists of an elongated screw machine contact biased by a helical spring and mounted in a through hole of a non-conductive substrate. One end of the contact includes a crown for engaging a solder ball lead of an IC package, and the contact includes an intermediate collar which maintains the contact within the through hole. The helical spring is disposed about the contact, with one end thereof engaging the lower end of the collar. The other end of the helical spring has contiguous coils and is of a reduced diameter so as to extend beyond the lower end of the non-conductive substrate to make electrical contact with a printed circuit board. When the test probe is compressed between the IC package and the printed circuit board, the inherent twisting of the helical spring causes the contact to tilt and make electrical contact with the contiguous coils, thereby establishing a direct electrical path between the IC package and the printed circuit board, with minimum resistance and minimum inductance.

Integrated circuit test probe

A connector assembly is provided for solderlessly connecting an integrated circuit package to a printed circuit board. In the first embodiment of the invention, a plurality of generally cylindrical resilient electrical contacts are disposed in through holes formed in a non-conductive substrate. The contacts are formed from a single conductor that is coiled in a helical fashion to form a contact which resembles a spring. Each spring-like contact is formed to begin with an annular rim defining a contact point. The conductor is then coiled in such a manner to form diametrically equal rings which are spaced equidistant apart. The spring-like contact is then concluded with a similar annular rim as to the beginning contact point. An intermediate portion equidistant from beginning and concluding rims is formed so that a small portion of coiled turns have a diameter which is larger than the other diameters defined by the annular rim. The enlarged intermediate portion of the spring-like contact engages the inner surface of the through holes in an interference fit. The beginning annular rim defines a contact point for receiving and electrically engaging a ball lead or land of a grid array package, while the concluding rim is for engagement with an underlying printed circuit board or semi-conductor device. Additionally, as a second embodiment, a resilient electrical contact formed from spring to resemble two cones joined at their bases is provided within each of the through holes.

Solderless grid array connector

A connector assembly is provided for solderless connection to a land grid array integrated circuit package. In the first embodiment of the invention, a plurality of generally &Sgr;-shaped electrical contacts are disposed in through holes formed in a non-conductive substrate. The electrical contacts are maintained within the through holes due to dimensional differences formed therebetween. In the second embodiment of the invention, a plurality of electrical contacts, each having a pad portion, are disposed in a non-conductive substrate, with the respective pad portions registering with an opening of the through hole. Each electrical contact having a spring arm extending through the non-conductive substrate from the pad portion.

Land grid array connector

A universal production ball grid array socket is provided for use with a ball grid array package. The socket will receive a ball grid array package and in turn can be mounted or plugged into an underlying circuit board. One embodiment of the socket includes a tulip-shaped contact which is capable of receiving ball grid array ball leads of various diameters. Another embodiment of the socket includes a ball receiving contact capable of clasping an inserted ball grid array ball lead. In still another embodiment the universal production ball grid array socket is translucent allowing for visual inspection of a ball grid array package and ball grid array socket combination. Methods are provided for mounting a plurality of ball leads onto the bases of a plurality of ball receiving contacts after the contacts have been mounted within the universal production ball grid array socket. Transition pins are also provided for allowing most integrated circuits to be used with the sockets of the subject invention and for adapting a ball grid array package to be capable of repeated engagement and disengagement of sockets of the subject invention.

Universal production ball grid array socket

A universal production ball grid array socket is provided for use with a ball grid array package. The socket will receive a ball grid array package and in turn can be mounted or plugged into an underlying circuit board. One embodiment of the socket includes a tulip-shaped contact which is capable of receiving ball grid array ball leads of various diameters. Another embodiment of the socket includes a ball receiving contact capable of clasping an inserted ball grid array ball lead. In still another embodiment the universal production ball grid array socket is translucent allowing for visual inspection of a ball grid array package and ball grid array socket combination. Methods are provided for mounting a plurality of ball leads onto the bases of a plurality of ball receiving contacts after the contacts have been mounted within the universal production ball grid array socket.

Method of mounting a plurality of ball leads onto a BGA socket

An adaptor pin for connection to a printed circuit board includes an elongated electrically conductive pin having an enlarged portion adjacent one end for forming a mechanical interference fit with a hole partially drilled through the circuit board. The pin has an enlarged cross-sectional solder portion intermediate the enlarged portion and the opposite end of the pin so as to limit the extent of penetration of the pin into the hole of the circuit board. The enlarged portion of each pin is electrically connected by soldering to a circuit path on the circuit board. By this arrangement, a rigid mechanical connection between the pin and the circuit board is effected, and thus subsequent reheating of the board for connecting a surface mounted chip to the opposite side of the board will not interfere with the electrical and mechanical connection between the adaptor pin and the circuit board.

Method of making a printed circuit board with adaptor pins

An electrical connector assembly is provided for releasable electrical connection of a high density memory module to a circuit board. An electrical connector assembly includes a base having an array of apertures extending therethrough for registration with both the contact pads of the memory module and of the circuit board. Resilient terminal assemblies are mounted in each of the apertures of the base. Each terminal assembly includes an electrically conductive terminal exposed at both ends of the terminal assembly and with a connection extending therebetween. The contacts and the connection of the terminal may be stamped and formed from a unitary strip of conductive metal. The terminal is insert molded in elastomeric material dimensioned to be frictionally retained in a corresponding aperture of the base. The dimensions of the elastomeric plug and the apertures are selected to control the amount of compression that is permissible as the electrical connector is engaged between the memory module and the circuit board.

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Frenchtown, NJ, United States of America

William Y Sinclair