Ltx Corporation

Leland Stanford Junior University

Planet Ate, Inc.

William Robert Creek

Mark E Deome

R Warren Necoechea

Stephen William Smith

David W Curry

Philip Earle Perkins

Bryan L Clausen, Sr

Bryan Clausen, Jr

Marvin L Wahl

Mery Clausen

One aspect of the present disclosure is a control device responsive to control signals for electrically coupling an input node configured for connection to a low impedance source to an output node configured for connection to a transmission line. The control device includes a first controlled impedance device having a pair of controlled nodes connected between the input node and the output node. The first controlled impedance device has a control node for controlling impedance values between the controlled nodes. Also included is a closed loop control circuit connected to the control node of the first controlled impedance device for varying impedance between the controlled nodes continuously over a range of impedance values based on parameters sensed by a parameter sense device. The closed loop control circuit maintains a constant relationship between an output impedance of the control device and transmission line impedance.

Method and apparatus for coupling an input node to an output node

A method and apparatus for a micromachine relay is provided. A pin controller comprises at least one spring pin designed to movably couple the pin controller to a device under test (DUT) to provide signals to the DUT. The pin controller further includes a micromachine relay coupled to the at least one spring pin to control the movement of the at least one spring pin and an integrated circuit for controlling the micromachine relay.

Integrated micromachine relay for automated test equipment applications

An apparatus to receive a response signal sent from a device under test. The apparatus includes pin electronics to identify a response signal contained in a composite signal. The composite signal is a composite, or sum, of the response signal and a test signal. The pin electronics has a driver to send the test signal to the device under test, and a receiver to receive the composite signal and to separate the response signal from the composite signal.

Separating device response signals from composite signals

A mixed signal integrated circuit testing system includes a system controller connected to a test head for controlling the testing operations of the mixed signal integrated circuit testing system. The test head is adapted to support a wide combination of both the analog and digital circuit testing modules. A DUT board, typically configured for a specific IC or family of ICs, is used to connect the circuit testing modules to the IC. The DUT board is connected to a DUT board interface that includes an analog DUT board interface adapter and a digital DUT board interface adapter. The digital DUT board interface adapter is connected directly to the digital circuit testing modules. The analog DUT board interface adapter is connected to a system configuration module that provides analog loading and conditioning circuitry as well as other circuitry that can be customized for testing specific ICs.

Mixed signal device under test board interface

A test circuit operable to examine both differential outputs and single outputs of a device under test (DUT), the circuit comprises a first circuit having as inputs a first output of the DUT and a first set of independent reference voltages, and an output of the first circuit coupled to a plurality of comparators. The test circuit further comprises a second circuit having as inputs a second output of the DUT and a second set of independent reference voltages, and an output of the second circuit coupled to the plurality of comparators. The test circuit further comprises a select circuit coupled to outputs of the comparators, the output of the first circuit and the output of the second circuit. The select circuit outputting the outputs of the first circuit and the second circuit or outputting the outputs of the comparators.

Differential comparator with a programmable voltage offset for use in an automatic tester

A programmable load circuit operable to generate a plurality of test signals is described. The programmable load circuit comprises a diode bridge coupled between an input and an output. The diode bridge compares the voltage on the input to the voltage on the output. The programmable load circuit also comprises a plurality of current sources. A first set of the plurality of current sources are coupled to intermediate nodes of the diode bridge. Additionally, the programmable load circuit comprises a switching circuit coupled between the intermediate nodes of the diode bridge and a second set of the plurality of current sources. Furthermore, the programmable load circuit also comprises a load regulator coupled to the output and the intermediate nodes of the diode bridge. The load regulator is configured to reduce leakage current on the output.

Programmable load circuit for use in automatic test equipment

A tester circuit generating differential signals, single ended signals, or a fast transitioning signal to exercise inputs of a device under test is described. According to one embodiment, the tester circuit includes a first circuit configured to generate a first test signal on an input of the first driver. The tester circuit also includes a second circuit configured to generate a second test signal on an input of a second driver. Further, the tester circuit also includes select signals and select logic to determine the different testing modes of the device under test.

Differential driver circuit for use in automatic test equipment

A tracking system comprising multiple satellite units and a master unit for selectively and individually locating each satellite unit. Each satellite unit receives a search signal from the master unit and transmits a response signal to the master unit when the search signal contains a search identity code which matches a unique identity code of the satellite unit. The master unit has user controls for selecting any one of the satellite units to be located and a memory for storing the unique identity code of each satellite unit. The master unit also has an indicator circuit for indicating the strength of the response signal and a display and speaker for visually and audibly indicating the strength to a user. The master unit is programmed such that when the user selects one of satellite units to be located, the master unit transmits a search signal having a search identity code which matches the unique identity code of the selected satellite unit. The tracking system also preferably includes a passive re-radiating strip to be attached to an object to be tracked. The strip receives signals from the master unit at a fundamental frequency and re-radiates the signals at a multiple of the fundamental frequency. The master unit indicates the strength of the re-radiated signals to the user, enabling the user to locate the strip.

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Fremont, CA, United States of America

William Robert Creek