Abbott Laboratories Corporation

William R Jones, Jr

James W Colburn

Millard D Longman

Catherine L Danial

Thomas L Barnes

A method of making a count probe for counting particles comprises the following steps. A count wafer is formed along with a core member having an opening for accepting the count wafer. The count wafer is applied to the opening in the core member to form an interference fit between the count wafer and the core member. After application of the count wafer to the opening in the core member, the core member is annealed to relieve stress in the core member.

Method of making stress relieved count probe

A multi-channel particle counting system corrects for coincidence errors by generating at least a first subtractive correction factor for any channel by taking counts from only channels that are lower than the particular channel being corrected. Optionally a second additive correction factor may be generated based on counts in all channels. The correction factor (s) are then, respectively subtracted from, or added to, the individual channel counts to generate an approximation of the true channel by channel counts.

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Hialeah, FL, United States of America

William R Jones, Jr