Applied Materials, Inc.

William R Bartlett

Norm Shendon

Jeffrey S Marks

Robert D Tolles

Arulkumar P Shanmugasundram

Norman Shendon

Victor Belitsky

James C Nystrom

Jim Tobin

A wafer polishing apparatus includes a carrier head having a central axis and a drive shaft coupled to the carrier head. A first input pulley or input gear A is coupled to the drive shaft to drive the carrier head about its central axis. A second input pulley or input gear A is coupled to the carrier head to drive the carrier head in a circular path about a point that is offset from the central axis of the carrier head. A controller , can regulate speeds of the input pulleys or input gears while the wafer is held in contact with a polishing pad . Rotation of the carrier head about a point that is offset from the axis of the carrier head can sweep the carrier head across the larger area of the polishing pad. The sweeping motion of the carrier head across the pad can help randomize non-uniformities in the pad and can reduce the amount of wear to the pad as the wafer is moved across it.

Driving a carrier head in a wafer polishing system

A chemical mechanical polishing apparatus has a polishing station, a transfer station, a carrier head to support a substrate, a rotatable carousel supporting the carrier head, a carousel drive shaft coupled to the carousel to rotate the carousel, and a carousel drive system. The carousel is rotatable between a first position in which the carrier head is in the polishing station and a second position in which the carrier head is in the transfer station. The carousel drive system includes a drive motor, a gear reduction box coupled to an output of the drive motor, and a brake system coupling the gear reduction box to the drive shaft.

Drive system for a carrier head support structure

A polishing apparatus including a plurality of polishing pads on respective rotating platens. The polishing platens, and therefore the attached pads also, may be of substantially different diameters. Multiple wafer heads can simultaneously polish multiple wafers on the multiple polishing pads or at different positions on one of the pads. The wafer heads are suspended from a rotatable carousel, which provides positioning of the heads relative to the polishing surfaces. Additionally, a loading/unloading station is provided. The carousel selectively positions the heads on the polishing surfaces, or positions one of the heads over the loading/unloading station while the remaining heads are located over polishing stations for substrate polishing, at which positions the wafers can be polished. The carousel can rotate to sweep all wafer heads attached thereto over respective polishing pads that they overlie.

Circumferentially oscillating carousel apparatus for sequentially processing substrates for polishing and cleaning

Circumferentially oscillating carousel apparatus for sequentially

A chemical mechanical polishing apparatus has a platen with a cavity with an opening to the top surface of the platen. A polishing pad is located at an upper surface of the platen. A flexible membrane is positioned in the cavity to define a first and a second volume. A pressure source is connected to the second volume to flex the membrane, and a lifting member is positioned in the first volume so that flexing of the membrane extends the lifting member through the opening to lift the substrate off the polishing pad. Alternately, de-ionized water may be forced through a passage in the platen and an aperture in the polishing pad to lift the substrate.

Method and apparatus for removing a substrate from a polishing pad in a

A method and apparatus for conditioning a polishing pad improves the polishing characteristics of the pad by providing an embedded pattern that facilitates polishing and reduces glazing. Moreover, the present invention conditions a pad without significantly abrading the polishing surface, thereby prolonging the pad's useful life. A series of independently rotatable rollers having a knurled outer surface is used to embed a pattern of score marks in the surface of the polishing pad. Alternatively, a knurled conical roller engages a radius of the pad. The apparatus is adaptable to either manual or automated processes. The present invention is particularly useful for conditioning polishing pads used in the fabrication of semiconductor wafers.

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Los Gatos, CA, United States of America

William R Bartlett