Agilent Technologies, Inc.

William P Darbie

John E McDermid

Cherif Ahrikencheikh

Rodney A Browen

Kay C Lannen

Jamie P Romero

A system that can test individual components having tolerances on a circuit board without complete access to every node on the board is disclosed. The system uses a method that develops test limits from a model of the board, component tolerances, and a list of accessible nodes. A method of reducing the complexity of the test problem by limiting the number of components under consideration is also disclosed. A method of reducing the complexity of the test problem by limiting the number of nodes under consideration is also disclosed. A method of picking nodes to apply stimulus to a board is also disclosed. Finally, a method of correcting for certain parasitics associated with tester hardware is disclosed.

Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test

A method for evaluating and correcting a model of an electronic circuit. A list is created which comprises the minimum number of components that must be specified by the operator in order to be able to compute values for the remaining circuit components. Correction of circuit models can be performed even in cases of limited accessibility to the circuit's nodes.

Method and apparatus for electronic circuit model correction

Method and apparatus for board model correction

Method and apparatus for selecting stimulus locations during limited access circuit test

Method and apparatus for selecting targeted components in limited access test

Method and apparatus for correcting for detector inaccuracies in limited access testing

Method and apparatus for limited access circuit test

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Longmont, CO, United States of America

William P Darbie