Dh Technologies Development Pte. Ltd.

William Morgan Loyd

Takashi Baba

Pavel Ryumin

Robert Haufler

Gregor Sprah

Alexandre V Loboda

Igor V Chernushevich

Alexander Tsipirovich

Mihajlo Dzepina

Robert E Haufler

A calibration apparatus for a mass analyzer includes an ion source device and a dual-purpose electron beam generating unit. The ion source device ionizes an analyte of a sample, producing analyte ions. The dual-purpose electron beam generating unit is positioned between the ion source device and the mass analyzer. In a first mode, the dual-purpose electron beam generating unit is used to create fragments of analyte ions of unknown mass-to-charge ratio. In a second mode, the dual-purpose electron beam generating unit is used to create ions of calibration compounds of known mass-to-charge ratio. All ions are subsequently transferred to the mass analyzer.

TOF mass calibration

A dissociation device fragments a precursor ion, producing at least two different product ions with overlapping m/z values in the dissociation device. The dissociation device applies an AC voltage and a DC voltage creating a pseudopotential that traps ions below a threshold m/z including the at least two product ions. The dissociation device receives a charge reducing reagent that causes the trapped at least two product ions to be charge reduced until their m/z values increase above the threshold m/z set by the AC voltage. The increase in the m/z values of the at least two product ions decreases their overlap. The at least two product ions with increased m/z values are transmitted to another device for subsequent mass analysis by applying the DC voltage to the dissociation device relative to a DC voltage applied to the other device.

Method for top down proteomics using ExD and PTR

A separation device separates an unknown intact mAb or reduced mAb subunits of a known mAb class from a sample. An ion source device ionizes the mAb. A mass spectrometer fragments the ionized mAb using an ECD device and mass analyzes resulting product ions using a mass analyzer, producing one or more product ion spectra. Theoretical product ion peaks are calculated for one or more constant portions of the mAb class. The theoretical product ion peaks are removed from the one or more product ion spectra, producing one or more difference product ion spectra. De novo sequencing is applied to the one or more difference product ion spectra, producing one or more candidate sequences for one or more variable portions of the mAb. A genome database is searched for matches to the one or more candidate sequences, producing one or more matched sequences for the one or more variable portions.

Top down analysis of antibodies in mass spectrometry

A ring stacked accelerator for use in a mass spectrometer includes a plurality of ring shaped plates arranged in a stack and is electrically coupled to a voltage divider that allows a substantially homogeneous electric field to be produced when the stack is energized. The voltage divider can include resistors and capacitors, where the capacitors are chosen to compensate for parasitic capacitances experienced by the plates. The ring stacked accelerator can be energized using an RF pulse. The ring stack accelerator can include one or more balancing capacitors for correcting effects that cause nonlinearity.

Homogenization of the pulsed electric field created in a ring stack ion accelerator

Ion optics devices and related methods of making and using the same are disclosed herein that generally involve forming a plurality of electrode structures on a single substrate. An aspect ratio of the structures relative to a plurality of recesses which separate the structures can be selected so as to substantially prevent ions passing through the finished device from contacting exposed, electrically-insulating portions of the substrate. The substrate material can be a material that is relatively inexpensive and easy to machine into complex shapes with high precision (e.g., a printed circuit board material). In some embodiments, discrete ion optical elements are disclosed which can be formed from a core material to which an electrically-conductive coating is applied, the core material being relatively inexpensive and easy to machine with high precision. The coating can be configured to substantially prevent outgassing from the core under the vacuum conditions typically experienced in a mass spectrometer.

Ion optical elements

In some embodiments, a time of flight mass spectrometer can comprise an input orifice for receiving ions, a first ion accelerator stage for accelerating the ions along a first path, at least one ion reflector for receiving said accelerated ions and redirecting said ions along a second path different than the first path, a detector for detecting at least a portion of the ions redirected by said at least one ion reflector, and at least first and second field free drift regions disposed between said first acceleration stage and said detector, wherein said second field free region is disposed in proximity of the detector. In some embodiments, the lengths of the field free drift regions can be selected so as to provide 1st and 2nd order corrections of the time of flight of the ions with respect to variation in their initial positions.

First and second order focusing using field free regions in time-of-flight

A lens assembly for use in mass spectrometry and a method for reducing contaminant build up on ion optic components in a lens assembly for use in a mass spectrometer are disclosed herein. In various embodiments of applicant's teachings, the lens assembly comprises a plurality of ion optic components assembled to form an ion lens and a heater. The plurality of ion optic components has a generally similar expansion coefficient. The heater is operatively coupled to the ion optic components. The heater heats the ion optic components to reduce the accumulation of debris on the ion optic components. In various embodiments, the method includes receiving, in a lens assembly, ions from an ion source. The lens assembly includes a plurality of ion optic components assembled to form an ion lens, the plurality of ion optic components having a generally similar expansion coefficient. The method also comprises heating the ion optic components to a first temperature.

Growing community of inventors

Sugar Land, TX, United States of America

William Morgan Loyd