Growing community of inventors

Scarsdale, NY, United States of America

William McMahon

Average Co-Inventor Count = 3.86

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 19

William McMahonRandy W Mann (7 patents)William McMahonYoann Mamy Randriamihaja (6 patents)William McMahonSuresh Uppal (5 patents)William McMahonAkhilesh Gautam (5 patents)William McMahonYuncheng Song (5 patents)William McMahonAndreas Kerber (4 patents)William McMahonEduard Albert Cartier (1 patent)William McMahonManjunatha Govinda Prabhu (1 patent)William McMahonTanya Nigam (1 patent)William McMahonAnil Kumar (1 patent)William McMahonSriram Balasubramanian (1 patent)William McMahonChad Weintraub (1 patent)William McMahonVivek Joshi (1 patent)William McMahonRichard Francis (1 patent)William McMahonWilliam McMahon (13 patents)Randy W MannRandy W Mann (32 patents)Yoann Mamy RandriamihajaYoann Mamy Randriamihaja (6 patents)Suresh UppalSuresh Uppal (12 patents)Akhilesh GautamAkhilesh Gautam (8 patents)Yuncheng SongYuncheng Song (6 patents)Andreas KerberAndreas Kerber (9 patents)Eduard Albert CartierEduard Albert Cartier (101 patents)Manjunatha Govinda PrabhuManjunatha Govinda Prabhu (38 patents)Tanya NigamTanya Nigam (13 patents)Anil KumarAnil Kumar (12 patents)Sriram BalasubramanianSriram Balasubramanian (5 patents)Chad WeintraubChad Weintraub (4 patents)Vivek JoshiVivek Joshi (2 patents)Richard FrancisRichard Francis (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Globalfoundries Inc. (13 from 5,671 patents)

2. International Business Machines Corporation (1 from 164,108 patents)


13 patents:

1. 10068660 - Methods, apparatus, and system for global healing of write-limited die through bias temperature instability

2. 10054630 - Methods, apparatus and system for screening process splits for technology development

3. 9916212 - Method, apparatus, and system for targeted healing of write fails through bias temperature instability

4. 9704600 - Method, apparatus, and system for global healing of write-limited die through bias temperature instability

5. 9702926 - Methods, apparatus and system for screening process splits for technology development

6. 9601188 - Method, apparatus and system for targeted healing of stability failures through bias temperature instability

7. 9601187 - Method, apparatus, and system for global healing of stability-limited die through bias temperature instability

8. 9599656 - Methods, apparatus and system for voltage ramp testing

9. 9548136 - Method to identify extrinsic SRAM bits for failure analysis based on fail count voltage response

10. 9500703 - Semiconductor structure having test device

11. 9372226 - Wafer test structures and methods of providing wafer test structures

12. 8907687 - Integrated circuit with stress generator for stressing test devices

13. 8817570 - Devices having bias temperature instability compensation

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12/3/2025
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