Xerox Corporation

William L Yeoh

Ramesh Nagarajan

Clara Cuciurean-Zapan

Xing Li

James M Maryniak

Richard James Eddy, Jr

Yongyi Ye

In an embodiment, a method of rendering an infrared mark, can involve providing an image path for an image processing apparatus, wherein the image path integrates infrared mark related functions with regular image processing functions of the image processing apparatus, and rendering the infrared red mark with the image processing apparatus, after subjecting the infrared mark to the infrared mark related functions in the image path of the image processing apparatus.

Image path that supports device based infrared mark imaging

Disclosed herein is a system and method for diagnosing a failure condition of an image processing apparatus. When a failure condition is detected in an image path during output of a document, a fault code is issued. The image processing apparatus is then capable of performing an internal diagnosis to generate a diagnostic report, and send the diagnostic report and fault code to an operator at a remote location. The system and method allows one to diagnose a problem or failure condition more quickly and efficiently, thereby cutting down on service time and costs.

System and method for diagnosing a failure condition in an image path of an image processing apparatus

A method to detect edges based on chrominance information alone or in combination with gray level values includes comparing chrominance values to a registration parameter based on chromacity measurements of a backing. To calibrate a system, a small scan obtains sample image data for the backing in the document feeder. Using the sampled image data, average chrominance values for the backing are determined. Based on the averages, a channel having a low chrominance contribution is selected as the registration channel. A registration parameter is calculated for automatic registration of documents based on the average chrominance and chrominance deviation for the registration channel.

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Rochester, NY, United States of America

William L Yeoh