International Business Machines Corporation

William K Hoffman, Jr

Darryl D Restaino

Eric Peter Solecky

Roger M Young

Jonathan Levy

Timothy L Holmes

Christopher E Pepe

A method for managing a metrology system includes receiving a part, identifying, with a processing device, a part type associated with the part, retrieving, with the processing device, test rule logic associated with the part type from a database, retrieving, with the processing device, measurement data associated with the identified part type, processing, with the processing device, the measurement data, applying, with the processing device, the test rule logic to the processed measurement data to determine whether the part should be measured, outputting the part responsive to determining that the part should not be measured, and incrementing, with the processing device, a counter and saving a value of the counter in the database responsive to outputting the part responsive to determining that the part should not be measured.

Growing community of inventors

Pleasant Valley, NY, United States of America

William K Hoffman, Jr