International Business Machines Corporation

William Joseph Ferrante

Kalman Zvi Meth

Adnan M Agbaria

Su-Hsuan Huang

Patrick Francis Caffrey

William Gole Tuel, Jr

Demetrios K Michailaros

Anton Prenneis

Carl John Radens

Stephen Wu

John Cassels

Louis L Hsu

William R Tonti

Jon Alfred Casey

Edward William Kiewra

Howard Hao Chen

The present disclosure is directed to numerical test data reporting using an image file and subsequent analysis of the test data. A method for capturing and analyzing test data in accordance with an embodiment includes: capturing multi-bit integer values of test data; writing each multi-bit integer value to a multi-bit vertical field in an image file; extracting the multi-bit integer values from the multi-bit vertical fields in the image file; and analyzing the extracted multi-bit integer values.

Numerical test data reporting in an image file and subsequent analysis

Reporting and/or analyzing test data from a plurality of tests of an array structure using a data array. One method includes obtaining the test data, and reporting the test data in a data array, which includes at least two portions representing different tests. Data stored in the data array is organized according to a translation table, which describes the locations of data for tests and criteria for data to be analyzed within the data array. Numerous other data arrangements such as a coordinate file listing a pre-defined maximum number of fail points, or a chip report including fail points by chip may also be generated. The data array reports all test data in a more easily generated and stored form, and may be converted to an image. A data analysis method for analyzing data using the data array is also presented.

Test data reporting and analyzing using data array and related data analysis

An on-chip temperature control system includes a temperature sensor, which monitors a temperature of a chip, and a hysteresis comparator which checks whether the temperature is in an acceptable range. A reference adjustment circuit is responsive to the hysteresis comparator to adjust an on-chip voltage to control the temperature locally by adjusting a local supply voltage, if the temperature is out of range.

On-chip power supply regulator and temperature control system

A structure and method are provided for forming a thermistor. Isolation structures are formed in a substrate including at least an upper layer of a single crystal semiconductor. A layer of salicide precursor is deposited over the isolation region and the upper layer. The salicide precursor is then reacted with the upper layer to form a salicide self-aligned to the upper layer. Finally, the unreacted portions of the salicide precursor are then removed while preserving a portion of the salicide precursor over the isolation region as a body of the thermistor. An alternative integrated circuit thermistor is formed from a region of thermistor material in an embossed region of an interlevel dielectric (ILD).

Method for integrating thermistor

A checkpoint of a parallel program is taken in order to provide a consistent state of the program in the event the program is to be restarted. Each process of the parallel program is responsible for taking its own checkpoint, however, the timing of when the checkpoint is to be taken by each process is the responsibility of a coordinating process. During the checkpointing, various data is written to a checkpoint file. This data includes, for instance, in-transit message data, a data section, file offsets, signal state, executable information, stack contents and register contents. The checkpoint file can be stored either in local or global storage. When it is stored in global storage, migration of the program is facilitated. When a parallel program is to be restarted, each process of the program initiates its own restart. The restart logic restores the process to the state at which the checkpoint was taken.

System of performing checkpoint/restart of a parallel program

Method of performing checkpoint/restart of a parallel program

Program products for performing checkpoint/restart of a parallel program

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Hyde Park, NY, United States of America

William Joseph Ferrante