Qualcomm Incorporated

William James McAvoy

Thomas Philip Speier

Brian Stempel

Michael Scott McIlvaine

Luke Yen

Robert Douglas Clancy

Pritha Ghoshal

Niket Choudhary

Patrick Eibl

Benjamin J Haass

Spencer Williams

A method, apparatus, and system for prefetching exclusive cache coherence state for store instructions is disclosed. An apparatus may comprise a cache and a gather buffer coupled to the cache. The gather buffer may be configured to store a plurality of cache lines, each cache line of the plurality of cache lines associated with a store instruction. The gather buffer may be further configured to determine whether a first cache line associated with a first store instruction should be allocated in the cache. If the first cache line associated with the first store instruction is to be allocated in the cache, the gather buffer is configured to issue a pre-write request to acquire exclusive cache coherency state to the first cache line associated with the first store instruction.

Method, apparatus, and system for prefetching exclusive cache coherence state for store instructions

A translation lookaside buffer (TLB) index valid bit is set in a first line of a virtually indexed, virtually tagged (VIVT) cache. The first line of the VIVT cache is associated with a first TLB entry which stores a virtual address to physical address translation for the first cache line. The TLB index valid bit of the first line is cleared upon determining that the translation is no longer stored in the first TLB entry. An indication of a received invalidation instruction is stored. When a context synchronization instruction is received, the first line of the VIVT cache is cleared based on the TLB index valid bit being cleared and the stored indication of the invalidate instruction.

Precise invalidation of virtually tagged caches

Circuits, systems, and related methods to measure a performance characteristic(s) associated with a semiconductor die and adjust a clock signal based on the measured performance characteristic(s) are provided. The adjusted clock signal can be used to provide a clock signal to a functional circuit provided in the semiconductor die to assure proper operation of the functional circuit while operating with performance, voltage, temperature (PVT) delay variations. In this regard, a performance monitoring circuit is provided in the semiconductor die that includes the functional circuit. As a result, the performance monitoring circuit may be exposed to similar delay variations as the functional circuit. The performance monitoring circuit is configured to measure a performance characteristic(s) associated with the semiconductor die. The performance characteristic(s) is used to adjust a clock signal to provide an adjusted clock signal to the functional circuit for proper operation based on the performance characteristic(s).

Circuits, systems and methods for adjusting clock signals based on measured performance characteristics

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Raleigh, NC, United States of America

William James McAvoy