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Isensecloud, Inc.

William J O'Banion

An-Dien Nguyen

Huy D Nguyen

Mark Rayor

An apparatuses relating generally to a test wafer, processing chambers, and method relating generally to monitoring or calibrating a processing chamber, are described. In one such an apparatus for a test wafer, there is a platform. An optical fiber with Fiber Bragg Grating sensors is located over the platform. A layer of material is located over the platform and over the optical fiber.

Processing chamber with optical fiber with bragg grating sensors

Test wafer with optical fiber with Bragg Grating sensors

An electronic sensor employs a strain gauge controlled by a microprocessor on a circuit board. The processor operates software to measure electric impulses from the strain gauge and to convert them into digitally recognizable numbers. Software provides for calibration of the electronic sensor specific fishing rods. The software also controls an LCD read-out device to allow the user to preset a known drag resistance force in suitable units of measure on the fishing reel and to continually read out the amount of force pressure on the fishing line after hook-up so that a user can apply maximum pressure on a fish while fighting the fish without breaking the fishing line.

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San Jose, CA, United States of America

William J O'Banion