Xilinx, Inc.

William H Pabst

Robert O Conn

Siuki Chan

Steven J Carey

A system replicates the rapid temperature increases that are believed to cause microbump failures in certain applications of programmable logic devices (PLDs). The system configures a PLD under test with a circuit that switches a large amount of current and generates a large amount of heat when the circuit is clocked. The system monitors the temperature of the PLD and controls the switching of the circuit to achieve a predetermined temperature within a predetermined time period. The PLD is cooled, and the thermal cycling is repeated. The system detects microbump failures and communicates failure data to a computer for logging and analysis.

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Palo Alto, CA, United States of America

William H Pabst