Altera Corporation

William H Hata

Adam J Wright

Mark Andrew Banke

John M Dicosola

Junzhao J Lei

A molded semiconductor package comprises a substrate, a semiconductor die mounted on the substrate, a molding compound encircling the die on the substrate, and one or more heat conductors in the molding compound that are thermally coupled to the substrate. Advantageously, the heat conductors are mounted in the molding compound near one or more of the corners of the die. The package may also include a lid. The heat conductors produce a more uniform distribution of heat in the substrate. The package is assembled by mounting the die on the substrate, mounting the heat conductors on the substrate and applying the molding compound to the substrate, the die, and the heat conductors mounted on the substrate. For packages that use a lid, the lid is then secured to the package and coupled to the heat conductors.

Heat spreading in molded semiconductor packages

Systems and methods are provided for marking integrated circuit defects on wafers to facilitate failure analysis. A wafer containing integrated circuits can be tested using a tester. Test data from the tester can be analyzed using integrated circuit design files to identify suspected faults. A fault location program can be used to identify the physical location of the faults. The fault location program uses information on the faults identified and CAD file information on the physical layout of the integrated circuit to map identified faults to actual physical positions. The fault location program may also generate laser control files. The laser control files can be used to control a laser system so that the laser system creates laser marks on the wafer surrounding each of the faults. The marked faults can be polished and examined under an electron microscope or analyzed using other failure analysis tools.

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Saratoga, CA, United States of America

William H Hata