Agere Systems Guardian Corp.

William Edward Fulmer

Johannes Gerardus Ransijn

Curtis James Miller

Mark Nelson

Gerard J Mietelski

Michael J Koziel

Stephen Michael Thompson

There is disclosed a first stub short bonded across conductive runners of a tuning stub at a distance preferably greater than a distance resulting in the desired frequency of operation of a voltage controlled oscillator tuned by the tuning stub. Thereafter, the voltage controlled oscillator is powered and tested to determine the frequency of operation of the voltage controlled oscillator. The position of a second stub short is determined based on the frequency of oscillation of the oscillator due to the presence of the first stub short, the geometry of the tuning stub and the desired frequency of operation of the voltage controlled oscillator. A second stub short is precisely positioned along the stub using automated equipment, relative to the position of the first stub short, to result in the desired frequency of operation of the voltage controlled oscillator. Depending on the relative positions of the first and second stub shorts relative to the voltage controlled oscillator, the first stub short may be removed. The voltage controlled oscillator may again be powered and tested to confirm the desired frequency of operation of the voltage controlled oscillator.

Automated voltage control oscillator tuning

An electrical contact, preferably made from a gold-plated, beryllium-copper flat stock which allows radio-frequency signal to pass with low noise, is provided within a housing. The electrical contact has two arms for contact with two external circuits. The electrical contact further has a pivot for allowing the electrical contact to adjust within the housing. The housing supports the electrical contact and is provided with a pivot point, such as a non-conducting rubber tip, for meeting the pivot of the electrical contact. The housing combined with one or more of the electrical contacts results in a testing port especially suited for providing high frequency communication between an electrical testing fixture and a device under test, such as a high-frequency hybrid integrated circuit.

Electrical contact and housing for use as an interface between a testing fixture and a device under test

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Sinking Spring, PA, United States of America

William Edward Fulmer