E.i. Dupont De Nemours and Company

William E Wolf

Robert H Livermore

Bruce Aaron Diner

Jerald D Lee

Steven Gutteridge

Bennett H Rockney

Michael Joseph Piovoso

Thomas W Simpson, Iii

Edmund H Smith, Jr

John G Elias

Derrick P Lattibeaudiere

Eugene Francis Palecki

John Taylor

David D Dreyfuss

Alan P Stamford

John J Majeski

Alfred Hirschle

Gary L Peterson

An imaging apparatus includes a collection of optical elements arranged in a predetermined sequence and cooperable to define a dark-field optical arrangement and a bright-field optical arrangement. The dark-field optical arrangement and a bright-field optical arrangement may be defined along the same or different optical path(s). At least one of the optical elements is operative to enable at least one of the dark field or the bright-field optical arrangements. In a first embodiment said one optical element is movable from a first to a second position to enable either the dark-field or the bright-field optical arrangement. In a second embodiment said one optical element is operable to enable simultaneously both the dark-field and the bright-field optical arrangements. Both opaque objects and phase objects in a fluid stream are able to be detected and quantified.

Optical probe having an imaging apparatus

A light collector for use with a photodetector that provides uniform photodetector output response over a polar angular range regardless of the polar angle of incidence of light upon the collector is disclosed. The light collector comprises a generally spheroidally-shaped light direction changer having a light diffusing surface, and a generally spheroidally-shaped polar attenuator. The geometric center of the photosensitive surface of the photodetector is adjacent to the vertex of the generally spheroidally-shaped light direction changer.

Light collector

An apparatus for optically detecting light-absorbing contamination in at least one particle of low optical-loss material comprises an optical integrating chamber for containing the particles. A laser for emitting a laser beam to illuminate the particles is mounted in the plane of rotation of a rotating mirror such that the laser beam scans in a fan scan. A scanning assembly is mounted in optical alignment with the laser for reflecting the laser beam and for causing the laser beam to scan the particles in the optical integrating chamber. A focusing assembly is mounted in optical alignment with the laser for focusing the scanning laser beam onto the particles in the chamber, the focusing assembly operating in conjunction with the scanning assembly so that light from the laser beam is reflected from the particles and is repeatedly scattered onto the interior walls of the integrating chamber. A light sensing assembly is mounted on the integrating chamber for receiving the repeatedly scattered light from the interior walls of the integrating chamber and for generating a signal indicative of the intensity of the repeatedly scattered light. A decrease in the intensity of the repeatedly scattered light is a function of the presence of light-absorbing contamination in the material.

Apparatus for optically detecting contamination in particles of low

A control arrangement for a galvanometer driven mirror whereby the angle of incidence of a beam on a holographic recording material is controlled includes a laser source and associated detector. The detector responds to a reflected position sensing beam incident thereon to generate electric currents. A ratio network forms the ratio of the sum and difference of the currents to generate an actual mirror position signal that is independent of the power output of the source of the sensing beam. An integrator is responsive to the error between the signal representative of the actual mirror position and a reference signal representative of a predetermined position of the mirror for forming a galvanometer position signal.

Apparatus for recording plural holographic images into a holographic

The present invention relates to a scanning beam optical processing system which combines Fourier optics with the ability to scan a stationary object plane. A scanning system moves a beam of light over a stationary medium and directs the light to a beam deflector. A descanning position control system re-establishes the beam deflected from the beam deflector along a stationary optical path for optical processing of information obtained from the medium. Hyperbolic lenses are used in the scanning system. The descanning position control system includes a controller comprising a detector for sensing a portion of the beam deflected from the beam deflector and for generating a signal representative of the position thereof and a differential amplifier for comparing the signal representative of the position of the deflected beam of light with a signal representative of the predetermined fixed reference axis for generating a beam deflector drive signal in response thereto.

Scanning beam optical signal processor

A scanning laser microscope system for assisting in the detection and characterization of fine details and structures of materials or other samples. The system can have means for enhancing light from the material to assist detection of anomalies, such as inclusions in the material and crystal lattice dislocations. The system can have means for enhancing fluorescent light emitted from the sample. The system can further have very precise means for processing signals representative of light detected from the material.

Scanning laser microscope system and methods of use

A laser scanning apparatus is characterized by a curved film-receiving field with a conforming photodetector assembly. In one embodiment, the photodetector assembly comprises a plurality of semiconductor elements. In other embodiments, the photodetector assembly includes a photodetector device mounted in light transmissive engagement with a transparent block for receiving light passed through a radiographic film.

Photodetector assembly for a laser scanning apparatus

An automatic on-line computer-aided inspection system for a running web utilizing a transverse web scanning means, detection means incorporating feature extraction and processing circuitry for generating unique output signals corresponding to said web scanning characteristic of web features of inspection interest, means converting the output signals to digital data words input sequentially to a digital computer, said computer applying one or more algorithms to said words, thereby calibrating the values of said features of said words, comparing said calibrated feature values to at least one set of product-qualifying values held in memory, and means responsive to the computer classifying the web as acceptable or non-acceptable as regards areas of preselected marketable size in the web.

On-line web inspection system

An inspection system for web materials, including electronic means responsive to means scanning the web for detecting a plurality of nonuniform appearance features of the web; means for discriminating these appearance features as to class to identify the significant electrical signal components thereof; means for electrically dividing the web into overlapping areas; means for counting the number of occurrences of the significant signal components over a series of scans within each of the overlapping areas; means for comparing each count with predetermined values to electrically define nonuniform appearance features according to area; and means for combining these nonuniform appearance features to recognize the occurrence of a visual defect class as it occurs within each overlapping area.

Web inspection system and method therefor

An electro-optical scanner for detecting variations in a web and generating output signals representative of the variations is provided with discriminator logic and alarm circuitry that indicates when the output signals shift from a value exceeding a predetermined positive (negative) threshold value to a value beyond a predetermined negative (positive) threshold value within a prescribed minimum period of time as an occurrence of an abrupt change in web density and processing circuitry for determining and indicating when the number of such occurrences per unit time exceeds a threshold or predetermined number.

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Chesapeake City, MD, United States of America

William E Wolf