Interconnect Devices, Inc.

Other

William E Thurston

David W Henry

Jason W Farris

Donald A Marx

Ulf R Langgard

Kiley Ray Beard

Bradley Smith

Ronald L Meek

Ron Meek

Timothy W Dowdle

A test contact may include a first portion having an open-ended rounded shape. The first portion may define an opening therethrough. The test contact may include a second portion having a curved structure. The first portion and the second portion may be formed integrally, and the second portion may be configured to contact a portion of a device lead.

Interconnect system

A spring probe having a barrel, plunger, spring and contact ring is provided in which the contact ring provides electrical contact between the plunger and the barrel. Two or more contact rings may be provided to improve the pointing accuracy of the probe.

Probe with contact ring

An eccentric offset Kelvin probe with a beveled contact tip radially offset from the longitudinal axis of the probe which provides a reduced tip spacing between adjacent pairs of probes.

Eccentric offset Kelvin probe

A contact spring probe includes a plunger and a spring with a pair of opposed closed coils separated by an open coil. The plunger is secured at one end to one set of closed coils with a shoulder, flange or barb extending from the body of the plunger.

Dual tapered spring probe

A contact probe including a length of wire with head, coil and tail sections. The head and tail sections may be lengthened and offset from the longitudinal axis of the coil section to allow the probes to be densely packed in a substrate material. Two probes may be interleaved to provide improved electrical performance of the probe.

Algoristic spring as probe

An electrical contact interface consists of a probe formed by a pair of oppositely extending plungers each having a contact tip, an inner shoulder and a rearwardly extending shaft terminating in a lug end. A coil spring is sleeved about the opposed plungers and is positioned between the opposite inner shoulders with the shafts extending toward each other and in constant sliding engagement with each other through the lug ends. The lug ends abut each other at an extreme travel relation of the plungers and prevent mutual disengagement of the plungers from within the coil spring. The probe is mounted in a fixture or other intermediate structure for positioning between circuit contacts. The probe finds particular use in applications requiring robust design and in which electrical contact must be maintained.

Electrical contact interface

A probe and test socket assembly wherein spring biased plunger probes of extraordinarily small diameter, such as 0.02 inch, are densely packed into a test socket for testing of integrated circuit chips. The socket is constructed in upper and lower halves with bores to receive the probes. To manufacture probes of such small diameter and to provide minimal and constant electrical resistance, the plungers and barrel of the probes are not crimped or otherwise secured together. The configuration of the socket bore walls in combination with the probe maintains the probe plunger and barrel together. The assembly is particularly useful in densely packed arrays of extremely fine diameter probes for testing densely packed test sites.

Probe and test socket assembly

A spring contact twisting electrical contact spring probe for testing electrical printed circuit boards includes a barrel having a spring seating end and an open end, a compression spring seated in the closed end of the barrel, and a plunger inserted into the barrel. The plunger includes a tail section, connected to a twister section comprising a square rod twisted along its longitudinal axis, and a shaft or probe section that protrudes from the barrel and includes the probe tip. Four crimps in the barrel retain the plunger inside the barrel and interact with the helical crests on the twister section to cause the plunger to rotate along its longitudinal axis as it reciprocates within the barrel. The twister section is retained entirely within the barrel at all times. The rotating plunger tip has edges that scrape off contaminants or coatings on the test sites of the circuit boards to obtain a sufficient electrical connection.

Growing community of inventors

Gladstone, MO, United States of America

William E Thurston