Victoreen, Inc.

William E Simon

Richard D Richards

A radiation analysis instrument is described for measuring the characteristics of radiation emanating from a source (XS). The instrument includes two absorbers (a, b) and corresponding detectors (10, 12) with the detectors being disposed in the path of the radiation and the absorbers being interposed between the corresponding detector and the source. A circuit (16) digitizes the analog signals derived by the two detectors and provides the digital values to a microcomputer (18) which stores these digitals values within a memory (50). A microprocessor (48) processes the digital signals stored within the memory (50) to analyze characteristics of the radiation emitted from and the potential applied across the source (XS). This instrument is particularly useful in measuring the kVp applied to X-ray tubes.

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Cleveland, OH, United States of America

William E Simon