Corning Incorporated

William E Schmitt

Mark Summa

Gregory E Williams

Marlene A Marro

An apparatus for measuring polarization dependent loss is disclosed featuring several fiber optic couplers combined in tandem and oriented such that the PDL noise of the measurement system is reduced to a negligible level. By matching the PDLs of the couplers and vectorally subtracting opposite phases of polarization, the PDL of the measurement system is virtually eliminated. Thus, the PDL noise floor is lowered to near zero and the PDL of the optical device-under-test (DUT) can be accurately measured. The system is relatively inexpensive to implement and offers needed versatility because it measures the PDL of optical devices that operate in a reflection mode or in a forward transmission mode. Thus, it provides one PDL measurement solution for both types of devices.

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Hornell, NY, United States of America

William E Schmitt