Agilent Technologies, Inc.

William E Barry

Steven Michael Fischer

James L Bertsch

Charles William Russ, Iv

Harvey D Loucks, Jr

Michael Ugarov

Yevgeny Kaplun

Described herein is an ion slicer that: a) accelerates an ion beam towards a first electrode comprising an ion entrance slit, where the first electrode blocks a portion of ions with high displacement from the axis of the ion beam, thereby slicing the ion beam; and then b) decelerates the ion beam after it is sliced.

Ion slicer with accelleration and decelleration optics

A mass calibration apparatus for a mass spectrometer includes a capillary, an analyte ion source coupled to the capillary at a first point, a reference mass ion source coupled to the capillary at a second point, downstream from the first point and a mass analyzer coupled to the capillary at a third point downstream from the first and second points. The reference mass ion source may be coupled to the capillary via a tee junction. The reference mass ion source includes a chamber, an ionization device situated within the chamber and one or more reference mass sources that are situated internally within the chamber or are situated external to and coupled to the chamber.

Reference mass introduction via a capillary

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Sunnyvale, CA, United States of America

William E Barry