Ade Corporation

Bionic Eye Technologies, Inc.

Ade Corproation

William Drohan

Douglas Bourne Shire

Peter A Harvey

Jaydeep K Sinha

Marcus D Gingerich

William Goldfarb

A method and apparatus of electrode interfaces for stimulating neurons and nerve cells that provides micro-fabricated electrode interfaces configured for conformal placement adjacent to neuron, nerves and neural tissue to thereby allow the neuron, nerves and neural tissue to grow around the electrode interfaces and allow for the creation depending on configuration of local or far electrical fields and current flows to stimulate them.

Micro-fabricated electrode arrays with flexible substrate for highly charge-efficient and selective stimulation of nerve tissue

A method to determine the systematic error of an instrument that measures features of a semiconductor wafer includes the following sequential steps. Collecting sensor data from measurement runs on front and back surfaces of a wafer while the wafer is oriented at different angles to the instrument for each run, yielding a front data set and a back data set for each angle. Then organizing the data in each set into a wafer-fixed coordinate frame. Reflecting all back surface data about a diameter of the wafer creates a reflected back data set. Subtracting the reflected back data from the front data for each wafer angle, and dividing the result by two, yields an averaged wafer shape for each load angle. Adding the reflected back data to the front data and dividing the result by two, yields an instrument signature for each load angle. The symmetric corrector is calculated by taking the average over all instrument signatures at each load angle. The symmetric corrector is successively rotated to the same angle as a front shape measurement and subtracted, yielding a calibrated wafer data set. A wafer mean is computed by averaging these calibrated wafer shape measurements. When the wafer mean is subtracted from the individual front side corrected shape measurements, a set of shape residual maps for each load angle results. The average of the aligned residuals is the asymmetric error. The systematic error is the sum of the symmetric and asymmetric errors.

Wafer shape accuracy using symmetric and asymmetric instrument error signatures

A testing system with real time/off line functionality allocation is disclosed. The real time functions are limited to movement of objects to be tested through the testing stations, operation of sensors to gather raw data, and storage of the raw data. The off line functions include removing artifacts in the raw data, analyzing the raw data according to various rules, and controlling the sorting of the tested objects according to the analysis. By limiting the real time processing to a few essential elements necessary for operation of the testing line, the testing line can proceed even if the off line functions are not operating.

Testing system with real time/off line functionality allocation

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Bedford, MA, United States of America

William Drohan