International Business Machines Corporation

Unity Ipr Aps

William David Ramsour

Samuel I Ward

Joachim Christoph Ante

Stephen Joseph Palmer

Ryan Caltabiano

Joseph Franklin Scheinberg

Paul Emile Burslem

Jun Zhou

Bao G Truong

Patrick R Crosby

A method for tracking game asset locations is disclosed. Content is created for an application using a first asset. The first asset includes asset data that describes at least a part of the content associated with the asset. The asset data is placed within one or more files within a location within one or more memories. A catalog associated with the application is created on the server. A catalog entry is created for the first asset. The catalog entry includes an address that uniquely identifies the first asset. A request is received from the application for asset data associated with the first asset, the request including the address. The address and the catalog are used to determine location data associated with the address. The determined location data is used to retrieve the asset data at the determined location. The retrieved asset data is returned to the application.

Addressable assets in software development

A method for automatically generating an electronic circuit layout with placed circuit elements includes receiving a user provided schematic, the user provided schematic comprising a plurality of circuit elements, each circuit element comprising general parameters. The method associates a plurality of first placement parameters with each of the plurality of circuit elements. The method retrieves, from a design library, design parameters associated with at least one of the plurality of circuit elements. The method selects a subset of circuit elements and receives placement inputs. The method generates a first placed layout configuration comprising adjusted placement parameters, based on the received placement inputs, the first placement parameters, and the design parameters. The method assigns absolute placement coordinates for each of the plurality of circuit elements based on the first placed layout configuration. The method generates an electronic circuit layout with placed circuit elements based on the absolute placement coordinates.

System and method for automated placement in custom VLSI circuit design with schematic-driven placement

A method for generating an electronic circuit layout with placed circuit elements receives a user provided schematic, the user provided schematic comprising a plurality of circuit elements, each circuit element comprising general parameters. The method associates a plurality of first placement parameters with each of the plurality of circuit elements, wherein the first placement parameters comprise a cell horizontal position, a cell vertical stacking position, and a cell vertical adjacent spacing. The method retrieves, from a design library, design parameters associated with at least one of the plurality of circuit elements. The method assigns first absolute placement coordinates for each of the plurality of circuit elements based on the first placement parameters and the design parameters. The method defines and performs an adjustment operation on the placement parameters of a selected subset of circuit elements, generating adjusted placement parameters. The method assigns second absolute placement coordinates based on the first placement parameters, the design parameters, and the adjusted placement parameters and generates an electronic circuit layout with placed circuit elements based on the second absolute placement coordinates.

System and method for improved placement in custom VLSI circuit design with schematic-driven placement

A method comprises generating a test pattern for a device under test (DUT), wherein the DUT comprises a plurality of scan chains coupled to a plurality of multiple input shift registers (MISRs). The plurality of faults detected by a first MISR and by a second MISR are identified. In the event the plurality of faults detected by the first MISR does not include any of the plurality of faults detected by the second MISR and the plurality of faults detected by the second MISR does not include any of the plurality of faults detected by the first MISR, the first MISR and the second MISR are coupled as an independent MISR pair. The test pattern is applied to the DUT to generate a scan chain output. The independent MISR pair captures the scan chain output to generate a test signature. The test signature is compared with a known good signature.

Scan chain fail diagnostics

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Pflugerville, TX, United States of America

William David Ramsour