Intersil Americas Inc.

Harris Corporation

William David Bartlett

Lawrence Pearce

An arrangement for measuring current through a phase section of a buck mode DC-DC converter includes an auxiliary integrated circuit containing an auxiliary power MOSFET and a pilot MOSFET coupled in parallel with a current path through a high side MOSFET of a half-bridge of the converter. The pilot MOSFET has a current path coupled to a current measurement terminal. The MOSFETs of the auxiliary circuit are time division multiplexed with the high side MOSFET, whereby a determination of current through the auxiliary high side MOSFET is based upon current through the pilot device and the geometric ratio of the size of the pilot device to that of the high side auxiliary MOSFET. The high side MOSFET is activated for a large number of switching cycles relative to the pilot circuitry, but the pilot circuitry is activated sufficiently often to derive a relatively accurate measure of current flow.

Time division multiplexed, piloted current monitoring in a switched mode DC&#x2014;DC voltage converter and phase current measurement calibration for a multiphase converter

A tapped delay line generates a fractional clock pulse signal for controlling a PWM pulse generator, such as used in a DC-DC converter. Operational parameters of the tapped delay are adjusted to maintain a desired fractional precision of the duty-cycle of the PWM clock pulse signal. In a first, phase locked loop (PLL) based embodiment, the tapped delay line-based digital PWM pulse generator includes a compensating phase locked-loop formed around an auxiliary tapped delay line that implements the voltage controlled oscillator of the PLL. In a second embodiment, the PWM pulse generator is configured as an 'open-loop' tapped delay line phase detector architecture, which avoids having to correlate parameters of the PLL delay line with those of the PWM delay line.

Robust fractional clock-based pulse generator for digital pulse width modulator

Method and apparatus for testing electrical devices which generate digital signals from analog signals applied to the devices. The testing determines whether or not the electrical devices are capable of properly generating all the different digital codes that correspond to the different analog signals in a particular bandwidth. The method and apparatus provide an external signal indicating whether an electrical device being tested functions properly.

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Melbourne Beach, FL, United States of America

William David Bartlett