Leica Microsystems Cms Gmbh

Leica Microsystems Heidelberg Gmbh

William C Hay

Johann Engelhardt

Vishnu Vardhan Krishnamachari

Volker Seyfried

Heinrich Ulrich

Juergen Hoffmann

Holger Birk

Bernd Widzgowski

Rafael Storz

Manuel Kremer

Ingo Böhm

Holger Nissle

Andreas Gorshöfer

A Raman microscopy imaging device () is described, having: a first laser light source () for emitting a first laser beam () having a first wavelength along a first light path (); a second laser light source () for emitting a second laser beam () having a second wavelength, different from the first wavelength, along a second light path () physically separated from the first light path (); a beam combining element () for collinearly combining the two laser beams () in one shared light path () directed onto a sample; a detector () for sensing a measured signal on the basis of the two laser beams () interacting with the sample; and an evaluation unit () for evaluating the measured signal sensed by the detector (). According to the present invention the first laser light source () is embodied as a pulsed source, and the second laser light source () as a continuous source.

Raman microscopic imaging device

A device () for illuminating a sample () is described, having: at least one pulsed laser light source () for repeated emission of a first laser pulse along a first light path () and of a second laser pulse along a second light path () physically separated from the first light path; a superimposition element () for collinear superimposition of the two laser pulses in a shared light path (); a delay stage () arranged in the first or the second light path (), for delaying one of the two laser pulses relative to the other laser pulse in such a way that the two laser pulses sent along the shared light path () onto the sample () exhibit a temporal superimposition; a shared chirp unit () arranged in the shared light path (), for frequency-modifying influencing both of the first laser pulse and of the second laser pulse; and at least one separate chirp unit () arranged in the first light path (), for frequency-modifying influencing only of the first laser pulse. The shared chirp unit () and the separate chirp unit () are coordinated with one another in order to achieve a target state. The separate chirp unit () is coupled to a control system () by which the separate chirp unit () is controllable with a control parameter dependent on the wavelength of the first laser pulse in order to establish the target state.

Device and method for illuminating a sample

A tunable multiple laser pulse scanning microscope and a method of operating the same is described, applying two pulsed laser beams with distinct wavelengths incident on a scanning spot of a sample to be imaged simultaneously or at a specific time delay. The microscope comprises at least two pulsed laser light sources emitting laser light of distinct wavelengths, an acousto-optic tunable filter (AOTF) for tuning at least one of the laser pulses, a delay stage provided upstream of the AOTF, and an actuator for moving delay stage depending on the time delay. As a result, the wavelength of at least one type of pulses is tuned, and the delay between at least two pulses of distinct wavelengths is adjusted.

Tunable multiple laser pulse scanning microscope and method of operating the same

An apparatus for mounting multiple lasers, including a mounting plate configured to receive multiple lasers and including a first side and a second side, wherein the first side and the second side are not coplanar; at least six leg portions, each including a support end; wherein at least three of the leg portions project away from the first side of the mounting plate and at least three of the leg portions project away from the second side of the mounting plate; and wherein the support ends of the leg portions projecting away from the first side are configured to support the mounting plate when the first side is facing in a generally downward direction, and the support ends of the leg portions projecting away from the second side are configured to support the mounting plate when the second side is facing in a generally downward direction.

Apparatus for mounting for multiple lasers

An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated.

Optical evaluation method by means of laser pulses and corresponding apparatus

An apparatus for mounting for multiple lasers () is disclosed. The multiple lasers () generate light that is guided via a light-guiding fiber to an optical system (). Provided for that purpose on the mounting plate () is a combining unit () that comprises multiple input ports (). Each of the lasers () possesses an output () for its light, each laser () being mounted on the mounting plate () in such a way that the respective output () is colinear with the respective pertinent input port () of the combining unit (). The combining unit () combines the light of the multiple lasers () into a single beam ().

Apparatus for mounting multiple lasers, and microscope

An apparatus for determining the light power level of a light beam ( ), having a beam splitter ( ) and a detector ( ) associated with the beam splitter ( ), is disclosed. The apparatus is characterized in that the beam splitter ( ) splits measuring light ( ) out of the light beam and conveys it to the detector ( ), and that the ratio between the light power level of the light beam ( ) and the light power level of the measuring light ( ) measured at the detector ( ) is constant over time.

Apparatus for determining a light power level, microscope, and method for microscopy

The invention relates to an optical system in the ray path of a confocal fluorescence microscope, comprising at least one laser light source ( ), a device positioned in the illuminating/detecting beam ( ) for separating the exciting light ( ) from the fluorescent light ( ), an objective ( ) arranged between the device and the object ( ), and a detector ( ) positioned downstream of the device situated in the detecting beam ( ). The aim of the invention is to increase the fluorescence yield of the system while retaining its compact structure. To this end the separating device comprises a mirror ( ) which is dimensioned and positioned in the illuminating and/or detecting beam ( ) in such a way that for the dark-field illumination of the object ( ) it reflects the non-expanded exciting beam arriving from the laser light source ( ) into the objective ( ) and permits the transit of the fluorescence light ( ) arriving from the object ( ) in the direction of the detector ( ) with full numerical aperture, the fluorescent light beam being reduced by the mirror ( ) cross-section active in the detecting beam ( ).

Optical system in the ray path of a confocal fluorescence microscope

An optical arrangement, in particular a laser scanning microscope, having a light source, in particular a laser light source, and an interruption device ( ) for a light beam ( ) of the light source, is configured, in the interest of reliable operation, in such a way that means ( ) for monitoring the functioning of the interruption device ( ) are associated with the interruption device ( ). The invention additionally concerns a shutter ( ) for a light beam ( ) of a light source, in particular a laser light source, which, again in the interest of reliable operation of an optical arrangement, is characterized by at least two movable components ( ) which are configured and arranged such that the mechanical momentum generated by a moving component ( ) or by several moving components is compensated for by the motion of the other component ( ) or components.

Laser scanning microscope and shutter for an optical system

An apparatus for selecting and detecting at least one spectral region of a spectrally spread light beam, preferably in the beam path of a confocal scanning microscope, the spread light beam being focussable in a focal line, is characterized, for non-overlapping detection of the spectrally spread light beam of the selected spectral regions in the context of an increased number of detectors and an error-tolerant arrangement, in that there is arranged in the spread light beam an optical component which reflects and/or refracts the light beam to a detector and whose optically effective region becomes smaller or larger along the surface, so that by orientation of the component with respect to the focal line and the resulting superposition of the focal line and surface, the spectral region arriving at the detector is definable.

Apparatus for selecting and detecting at least one spectral region of a spectrally spread light beam

A laser scanning microscope, preferably a confocal laser scanning microscope, and a method for reference correction for a laser scanning microscope, in particular for a confocal laser scanning microscope, having an illumination beam path extending between a laser light source and a specimen, and a detection beam path extending between the specimen and a detection device, is characterized, for error correction with at least one reference beam path used for reference measurement, in that reference light can be coupled out of the illumination beam path into the reference beam path, and that the reference light is qualitatively and/or quantitatively detectable by a detection device.

Growing community of inventors

Heppenheim, Germany

William C Hay