Micron Technology Incorporated

Intel Corporation

William C Filipiak

Violante Moschiano

Akira Goda

Andrea D'Alessandro

Tommaso Vali

Mark Alan Helm

Jeremy Binfet

Emilio Camerlenghi

Mark A Hawes

Changhyun Lee

Tecla Ghilardi

Ugo Russo

Liang Yu

Elancheren Durai

Quincy R Holton

Brett Hunter

Adam Satar

David R Silwanowicz

Kishore Kumar Muchherla

Sampath K Ratnam

Kevin Roy Brandt

Dheeraj Srinivasan

Todd A Marquart

Erwin E Yu

Michael G McNeeley

Methods, apparatuses and systems related to managing deck-specific read levels are described. The apparatus may include a memory array having the memory cells organized into two or more decks. The apparatus can determine a delay between programming the decks. The apparatus can derive and implement the deck-specific read levels by selectively adjusting a base read level with an offset level according to the delay and/or the targeted read location.

Apparatus with post-manufacturing data update mechanism and methods for operating the same

Systems, devices, and methods related to reset read are described. A reset read may be employed to initiate a transition of a portion of memory array into a first state or maintain a portion of memory array in a first state, such as a transient state. A reset read may provide a highly-parallelized, energy-efficient option to ensure memory blocks are in the first state. Various modes of reset read may be configured according to different input.

Memory array reset read operation

Methods of operating a memory, and apparatus configured to perform similar methods, include determining a voltage level of a stepped sense operation that activates a memory cell of the memory during a programming operation for the memory cell, and determining a voltage level of a ramped sense operation that activates the memory cell during a read operation for the memory cell.

Apparatus and methods for determining data states of memory cells

A request is received from a host system to execute a portion of a memory management operation associated with a memory cell of a plurality of memory cells of one or more memory devices. A voltage parameter level associated with execution of the portion of the memory management operation is identified. A determination is made that a comparison of the voltage parameter level with a voltage parameter level threshold satisfies a condition. A power management action is performed in response to the condition being satisfied.

Power management based on detected voltage parameter levels in a memory sub-system

One embodiment of a memory device includes an array of multiple-level memory cells and a controller. The controller is configured to program the multiple-level memory cells via a multiple-pass programming operation, the multiple-pass programming operation to program lower page data in a first pass and program higher page data in a second pass such that memory cells to be programmed to a higher level are programmed in parallel with memory cells to be programmed to a lower level.

Programming memory cells at two different levels in parallel

A set of memory management operations is executed on multiple memory dies of a memory sub-system. Voltage parameter levels corresponding to the set of memory management operations are determined. Information representing a voltage parameter level and a corresponding portion of the set of memory management operations is determined based on the set of voltage parameter levels. A request is received from a host system to execute a target portion of a memory management operation. First information corresponding to the target portion of the memory management operation is identified. Based on the first voltage parameter level, power management action is performed.

Memories having a controller configured, during a pre-charge portion of a read operation, to apply a sequence of increasing voltage levels concurrently to each access line of a plurality of access lines, wherein each voltage level of the sequence of increasing voltage levels is higher than any previous voltage level of the sequence of increasing voltage levels and lower than any subsequent voltage level of the sequence of increasing voltage levels, and determine a particular voltage level of the sequence of increasing voltage levels corresponding to a point at which all memory cells of the plurality of strings of series-connected memory cells are first deemed to be activated while applying the sequence of increasing voltage levels.

Apparatus for determining a pass voltage of a read operation

One embodiment of a method for programming multiple-level memory cells includes programming lower page data to memory cells in a first pass of a multiple-pass programming operation. The method includes programming higher page data to the memory cells in a second pass of the multiple-pass programming operation such that higher page data subject to the programmed lower page data is programmed prior to higher page data subject to erase data.

Programming memory cells where higher levels are programmed prior to lower levels

Apparatus having plurality of data lines each selectively connected to a respective string of series-connected memory cells, a plurality of registers each configured to indicate a state of a respective data line, and logic configured to indicate when each data line of the plurality of data lines has a particular state might facilitate determination of a pass voltage of a read operation.

Methods for determining data states of memory cells

Performing a first set of scans on a memory device in a memory system with a first time interval between each scan of the first set of scans to detect errors on the memory device, determining, from performing the first set of scans, that a rate of errors being detected on the memory device is changing, and performing a second set of scans with a second time interval between each scan of the second set of scans to detect errors on the memory device, in response to determining that the rate of errors being detected on the memory device is changing, wherein the second time interval is different than the first time interval.

Adaptive scan frequency for detecting errors in a memory system

One embodiment of a method for programming multiple-level memory cells includes programming lower page data to memory cells in a first pass of a multiple-pass programming operation. The method includes reprogramming the lower page data to the memory cells prior to programming higher page data to the memory cells in a second pass of the multiple-pass programming operation.

Programming multiple-level memory cells with multiple-pass

Methods of operating a memory, and memory configured to perform similar methods, might include sensing a state of each data line of a plurality of data lines while increasing a voltage level applied to each access line of a plurality of access lines commonly connected to a plurality of strings of series-connected memory cells, ceasing increasing the voltage level applied to each access line of the plurality of access lines in response to the state of each data line of the plurality of data lines having a particular condition, changing a voltage level applied to a particular access line of the plurality of access lines to a particular voltage level, and sensing a state of each data line of a subset of the plurality of data lines while applying the particular voltage level to the particular access line.

Growing community of inventors

Boise, ID, United States of America

William C Filipiak