Wolfson Microelectronics Limited

William Brian Fallon

Nicholas Roche

Ian Bowman Brockbank

Martin David Twigg

Ricky Wong

An apparatus is provided for monitoring and controlling a device under test, the device under test comprising a plurality of registers, each register having a register value and comprising a plurality of data bits for controlling a setting or settings of the device under test. The apparatus comprises display means for displaying an interactive register map to a user. The interactive register map is configured to display a plurality of register values simultaneously, and further adapted to display one or more data fields corresponding to each register value, each data field relating to one or more of the data bits and having a first indicator for representing a corresponding device setting. In this manner, a user can readily appreciate which device settings are controlled by the same register value, and hence can be written simultaneously.

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Edinburgh, United Kingdom

William Brian Fallon