Symyx Technologies, Inc.

Other

Synyx Technologies, Inc.

William B Archibald

Eric W McFarland

Marc D Hornbostel

Earl Danielson

Thomas R Boussie

Thomas Crevier

Dieter J Schaefer

Alfred W Archibald

A system for monitoring infrared absorption of each of a plurality of materials contained in an array has an infrared transparent substrate for the array of materials. An infrared radiation source irradiates the materials in the array with infrared radiation. An infrared detection system monitors material absorption of the infrared radiation by the materials. A method of monitoring the infrared absorption spectrum of a library of materials includes synthesizing an array of material on a substrate. The materials are irradiated with infrared radiation and the absorption of the infrared radiation by the materials is monitored for each material.

Methods and apparatus for spectroscopic imaging of materials in an array

Methods and apparatus for screening diverse arrays of materials using infrared imaging techniques are provided. Typically, each of the individual materials on the array will be screened or interrogated for the same material characteristic. Once screened, the individual materials may be ranked or otherwise compared relative to each other with respect to the material characteristic under investigation. According to one aspect, infrared imaging techniques are used to identify the active sites within an array of compounds by monitoring the temperature change resulting from a reaction. This same technique can also be used to quantify the stability of each new material within an array of compounds. According to another aspect, identification and characterization of condensed phase products is achieved, wherein library elements are activated by a heat source serially, or in parallel. According to another aspect, a Fourier transform infrared spectrometer is used to rapidly characterize a large number of chemical reactions contained within a combinatorial library.

System for infrared spectroscopic imaging of libraries

This invention discloses methods, materials, and devices for making and screening combinatorial libraries to identify semi-conducting and thermoelectric materials. The disclosed method includes preparing a combinatorial library of materials, and identifying library members that are semiconductors. The method may include determining a thermoelectric figure of merit, ZT, for each member of a second combinatorial library of materials. The method determines ZT by applying an oscillatory voltage across the library members, measuring power dissipated by library members, and calculating ZT from the power dissipated. The method may also include isolating single-phase materials of the semiconducting library members. The present invention also discloses an apparatus for discovering thermoelectric materials using combinatorial techniques. The apparatus includes a first combinatorial library of materials comprised of thin films arrayed on a substrate, and a device for identifying semiconducting members of the first combinatorial library. In addition, the apparatus may include a device for measuring ZT&#x2014;a voltage source for applying an oscillatory electrical potential across members of a second combinatorial library arrayed on a substrate, and a device for measuring the resulting power dissipated by library members. The apparatus may also include a device for isolating single-phase materials of library members that were identified as semiconductors.

Method and apparatus for screening combinatorial libraries of semiconducting properties

Computer programs and computer-implemented methods implement techniques for evaluating experimental data from a library of materials. The techniques receive a plurality of images of a library of materials that includes an array of members associated with locations in the library. User input identifying a plurality of regions of interest is received. A series of reduced data values is determined for one or more of the regions of interest as a statistical function of a plurality of pixel values for pixels in the corresponding regions. A figure of merit is calculated from one or more of the series of reduced data values for a library member at the corresponding library location. The regions of interest include a plurality of pixels in the images and correspond to locations in the library.

Analysis of chemical data from images

Rapid spectrum assay of multiple samples with infrared light is made possible by devices and methods that increase total light throughput. Multiple wavelength scan with Fourier analysis is combined with large numbers of sample wells located within infrared light compatible solid materials. In particular, very large scale measurement devices and systems for their use are fabricated from lithography and other techniques used for semiconductor processing.

High throughput screening with parallel vibrational spectroscopy

Infrared spectroscopy imaging of libraries

Methods and apparatus for screening diverse arrays of materials are provided. In particular, techniques for rapidly characterizing compounds in arrays of materials in order to discover and/or optimize new materials with specific desired properties are provided. The substrate can be screened for materials having useful properties, and/or the resulting materials can be ranked, or otherwise compared, for relative performance with respect to useful properties or other characterizations. In particular, systems and methods are provided for screening a library of magnetic materials for their bulk magnetization, saturation magnetization, and coercivity by imaging their individual optical Kerr rotation, screening a library of dielectric materials for their dielectric coefficients by imaging their individual electro-optical rotation and screening a library of luminescent materials by imaging their individual luminescent properties under a variety of excitation conditions. Optical or visible luminescence systems are also provided as well as their application to screening libraries of different materials.

Optical systems and methods for rapid screening of libraries of different materials

Computer programs and computer-implemented methods are disclosed for extracting and analyzing combinatorial chemical data from images. The invention receives a stream of data, identifies a plurality of regions of interest and determines a series of values for one or more regions of interest. The library includes a plurality of members. The data stream includes a series of images of the library. Each region of interest corresponds to a location in each of the images and to a location in the library. The series of values for each region includes a value for each of the images. Particular embodiments have the following features. The invention calculates a figure of merit for a library member from each series of values. The stream of data comprises a series of images generated at a frequency of greater than about 1, 6, 12 or 30 frames per second. The series of images is captured from a beginning of a combinatorial experiment to an end of a commercial experiment. The regions of interest are identified after the series of images has been captured. The images are infrared images. The figure of merit is an emittance change, a phase transition point or a thermoelectric figure of merit for a library member. Regions of interest are identified by a user and have a user-defined shape. The series of values for each region is determined based on a user-defined computation. A graphical representation of the figures of merit is displayed.

This invention discloses methods, materials, and devices for making and screening combinatorial libraries to identify semi-conducting and thermoelectric materials. The disclosed method includes preparing a combinatorial library of materials, and identifying library members that are semiconductors. The method may include determining a thermoelectric figure of merit, ZT, for each member of a second combinatorial library of materials. The method determines ZT by applying an oscillatory voltage across the library members, measuring power dissipated by library members, and calculating ZT from the power dissipated. The method may also include isolating single-phase materials of the semiconducting library members. The present invention also discloses an apparatus for discovering thermoelectric materials using combinatorial techniques. The apparatus includes a first combinatorial library of materials comprised of thin films arrayed on a substrate, and a device for identifying semiconducting members of the first combinatorial library. In addition, the apparatus may include a device for measuring ZT&mdash;a voltage source for applying an oscillatory electrical potential across members of a second combinatorial library arrayed on a substrate, and a device for measuring the resulting power dissipated by library members. The apparatus may also include a device for isolating single-phase materials of library members that were identified as semiconductors.

Method and apparatus for screening combinatorial libraries for semiconducting properties

Infrared spectroscopic imaging of libraries

A method and apparatus for high-throughput determination of phase change points of combinatorial libraries of metal alloys uses an infrared camera to monitor temperature-dependent changes in emissivity/reflectivity of the alloys. An infrared focal plane array monitors the emissivity/reflectivity changes over time, and the intensity of each heated member over time is correlated with temperature to detect the phase change points of the members.

Parallel screen for rapid thermal characterization of materials

An improved material for a thermoelectric device and thermoelectric systems incorporating the same.

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Foster City, CA, United States of America

William B Archibald