Mochii, Inc.

Fathom Radiant, Pbc

Fathom Computing

William Andregg

Christopher Su-Yan Own

Andrew Bleloch

Michael Andregg

Robert T Weverka

Erik Charles Nelson

Lionel Clermont

Dane R Austin

Optical communication system communicates between an array of originating tiles and an array of terminating tiles. Each array is associated with a lenslet array, such as a two-layer array which has two layers of lenslets. Each originating tile has an array of transmitters and each terminating tile has an array of receivers. Each tile is associated with a common lenslet or lenslet pair. A beamlet from a representative transmitter passes through the lenslet pair adjacent to its tile to become a collimated beam whose angle is related to the location of the transmitter. The collimated beam passes through the receiver lenslet pair adjacent to the tile containing the receiver associated with the representative transmitter, and is focused onto that receiver by that lenslet pair. The system may operate in the reverse direction, wherein the transmitters are transmitter-receivers, the receivers are receiver-transmitters, and a beam from a receiver-transmitter is directed to its corresponding transmitter-receiver.

Optical shuffle computation network

Optical systems for performing matrix-matrix multiplication in real time utilizing spatially coherent input light and wavelength multiplexing.

Wavelength multiplexed matrix-matrix multiplier

A scanning transmission electron microscope for imaging a specimen includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A stage is provided to hold a specimen in the path of the electron beam. A beam scanner scans the electron beam across the specimen. A controller may define one or more scanning areas corresponding to locations of the specimen, and control one or more of the beam scanner and stage to selectively scan the electron beam in the scanning areas. A detector is provided to detect electrons transmitted through the specimen to generate an image. The controller may generate a sub-image for each of the scanning areas, and stitch together the sub-images for the scanning areas to generate a stitched-together image. The controller may also analyze the stitched-together image to determine information regarding the specimen.

Scanning transmission electron microscopy for imaging extended areas

A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio. Alternatively or in addition, the transmission electron microscope may be adapted to operate the specimen holder to move the specimen in relation to the beam optics during exposure or between exposures to operate the transmission electron microscope in an incoherent mode.

Incoherent transmission electron microscopy

A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule.

A scanning transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam to a probe, such as for example a longitudinally stretched probe. A stage is provided to hold a specimen in the path of the electron beam. The specimen may include one or more elongated objects, such as for example polymers to be sequenced. A beam scanner scans the electron beam across the specimen. A controller may define one or more scanning areas corresponding to the locations of the elongated objects, and control one or more of the beam scanner and stage to selectively scan the electron beam probe in the scanning areas. The controller may also tune the beam optics during imaging. One or more detectors are provided to detect electrons transmitted through the specimen to generate an image for each of the scanning areas. The controller may also analyze the one or more images to determine information regarding the specimen, such as for example to sequence a polymer.

Growing community of inventors

Woodside, CA, United States of America

William Andregg