Analog Devices,inc.

Volterra Semiconductor Corporation

Analog Devices Imi, Inc.

University of California

Integrated Micro Instruments, Inc.

Other

Analog Devices Global

Onix Microsystems, Inc.

William Albert Clark

Mark Alan Lemkin

Thor N Juneau

John Albert Geen

Allen W Roessig

David B Lidsky

Anthony J Stratakos

Andrew J Burstein

Jinbo Kuang

James M Bustillo

Timothy J Brosnihan

Charlie Sullivan

Roger T Howe

Xin Zhang

David Horsley

Gaurav Vohra

Steven J Sherman

Jiefeng Yan

Edward L Wolfe

Phong T Nguyen

Robert A Conant

Vineet Kumar

Mehrnaz Motiee

Thor Juneau

Michael W Judy

Ronald Alan Kapusta

James M Lee

James Doscher

Erdinc Tatar

Vikas Choudhary

Trey Allen W Roessig, Iii

Kamatchi Saravanan Alagarsamy

Jishnu Choyi

Microelectromechanical systems (MEMS) capacitive strain gauge sensors are described. The strain gauge sensors include a lever configured to mechanically amplify a strain response. In some embodiments, an anchored beam is coupled to the effort arm of the lever and a movable sensing finger to the resistance arm. The effort arm may be shorter than the resistance arm, thus providing a mechanical amplification.

Lever based differential capacitive strain gauge with acceleration rejection

Techniques for self-testing of microelectromechanical systems (MEMS) inertial sensors are described. Some techniques involve testing inertial sensor characteristics such as an accelerometer's sensitivity to acceleration and a gyroscope's sensitivity to angular motion. The tests may be performed by providing a test signal, which simulates a stimulus such as an acceleration or angular rate, to a MEMS inertial sensor and examining the sensor's output. The efficacy of such self-tests may be impaired by spurious signals, which may be present in the sensor's environment and may influence the sensor's output. Accordingly, the self-testing techniques described herein involve detecting the presence of any such spurious signals and discarding self-test results when their presence is detected. In some embodiments, the presence of spurious signals may be detected using a signal obtained by mixing the response of the MEMS inertial sensor with a reference signal substantially in quadrature with the test signal.

Methods and systems for self-testing MEMS inertial sensors

Systems and methods for sensing angular motion using a microelectromechanical system (MEMS) gyroscope are described. These systems and methods may be useful for sensing angular motion in the presence of low-frequency noise, which may be noise below 1 KHz. In a system for sensing angular motion, low-frequency noise may give rise to duty cycle jitter, which may affect the demodulation of the sense signal and cause errors in angular motion estimates. The systems and methods described herein address this problem by relying on double-edge phase detection technique that involves sensing when the rising and falling edges of the resonator signal deviate from their expected values in the idealized 50% duty cycle scenario. To prevent the formation of ripples in the double-edge phase detection that may otherwise affect the demodulation of the sense signal, a switch may be used. The switch may be maintained in a non-conductive state when a ripple is received.

Systems and methods for sensing angular motion in the presence of low-frequency noise

Sense amplifiers for use in connection with microelectromechanical system (MEMS) gyroscopes are described. The sense amplifiers may be configured to change the level of a gyroscope signal, i.e., the signal produced by a gyroscope in response to angular motion, to a level suitable for processing circuitry arranged to infer the angular velocity. The sense amplifier may further provide a DC discharge path allowing for discharge of the DC component of the output signal. The DC discharge path may include an anti-aliasing filter and a resistive circuit. The anti-aliasing filter may filter the output signal to maintain the resistive circuit in the linear region. The anti-aliasing filter may be designed with a frequency response such that discrete frequency sub-bands are blocked or at least attenuated. The frequency sub-bands may be tuned to substantially match the gyroscope's resonant frequency and its integer multiples.

Sense amplifiers for gyroscopes and related systems and methods

Various embodiments mitigate the risk of frequency-lock in systems having multiple resonators by dynamically changing the frequency at which at least one of the resonators is driven. More particularly, the drive frequency of at least one of the resonators is changed often enough that the multiple resonators do not have time to achieve frequency lock. Changes in the oscillation of the resonators may be analyzed to determine, for example, acceleration of such systems. Some embodiments implement self-test by assessing expected performance of a system with toggling drive frequencies. More particularly, some embodiments implement self-test by artificially inducing displacement of a movable member of a system.

Method and apparatus for driving a multi-oscillator system

A microelectromechanical system (MEMS) accelerometer is described. The MEMS accelerometer is arranged to limit distortions in the detection signal caused by displacement of the anchor(s) connecting the MEMS accelerometer to the underlying substrate. The MEMS accelerometer may include masses arranged to move in opposite directions in response to an acceleration of the MEMS accelerometer, and to move in the same direction in response to displacement of the anchor(s). The masses may, for example, be hingedly coupled to a beam in a teeter-totter configuration. Motion of the masses in response to acceleration and anchor displacement may be detected using capacitive sensors.

Anchor tracking for MEMS accelerometers

A microelectromechanical systems (MEMS) accelerometer is described. The MEMS accelerometer may comprise a proof mass configured to sense accelerations in a direction parallel the plane of the proof mass, and a plurality of compensation structures. The proof mass may be connected to one or more anchors through springs. The compensation structures may be coupled to the substrate of the MEMS accelerometer through a rigid connection to respective anchors. A compensation structure may comprise at least one compensation electrode forming one or more lateral compensation capacitors. The compensation capacitor(s) may be configured to sense displacement of the anchor to which the compensation structures is connected.

Anchor tracking apparatus for in-plane accelerometers and related methods

An accelerometer has a movable mass suspended above a substrate, and a variable acceleration capacitor supported by the substrate. The movable mass has a mass anchor securing the mass to the substrate, while the acceleration capacitor has both a stationary finger extending from the substrate, and a movable finger extending from the movable mass. The accelerometer also has a variable stress capacitor, which also includes the stress finger, for determining movement of the mass anchor relative to the substrate.

Accelerometer with offset compensation

A MEMS sensor includes a micro-electromechanical structure, a detection circuit, and a self-test circuit to test the health of the MEMS sensor during runtime operations. The self-test circuit is configured to inject into the micro-electromechanical structure a plurality of injected test signals that are broad-band frequency-varying frequency signals, which are based on spread spectrum based modulation. The injected test signals may a magnitude that is below an observable threshold of the sensor signal as well as a test-signal bandwidth that overlaps with a substantial portion of the sensor bandwidth, including the stimulus of interest.

Spread-spectrum MEMS self-test system and method

Error sources relating to the drive signal applied to the resonator of an inertial sensor, such as in-phase offset errors relating to the drive signal and/or electronic pass-through of the drive signal to accelerometer sense electronics, are detected by modulating the drive signal and sensing accelerometer signals that are induced by the modulated drive signal. Error sources related to aerodynamics of an inertial sensor resonator are detected by modulating the distance between the resonator and the underlying substrate and sensing accelerometer signals that are induced by such modulation. Compensating signals may be provided to substantially cancel errors caused by such error sources.

Offset detection and compensation for micromachined inertial sensors

Error sources related to aerodynamics of an inertial sensor resonator are detected by modulating the distance between the resonator and the underlying substrate and sensing modulated error signals in the accelerometer that are induced by such modulation. Compensating signals may be provided to substantially cancel errors caused by such error sources.

Detection and mitigation of aerodynamic error sources for micromachined inertial sensors

Detecting and/or mitigating the presence of particle contaminants in a MEMS device involves converting benign areas in which particles might become trapped undetectably by electric fields during test to field-free regions by extending otherwise non-functional conductive shield and gate layers and placing the same electrical potential on the conductive shield and gate layers. Particle contaminants can then be moved into detection locations remote from the potential trap areas and having particle detection structures by providing some mechanical disturbance.

Detection and mitigation of particle contaminants in MEMS devices

An inertial sensor includes driving piezoelectric transducers for enabling an oscillation of a resonator, sensing piezoelectric transducers for enabling a detection of a movement of the inertial sensor, and piezoelectric compensating elements substantially equidistantly among the driving and the sensing piezoelectric transducers, wherein the compensating elements and the resonator form corresponding capacitors having capacitive gaps, and wherein, during the oscillation of the resonator, changes in electrostatic charges stored in the capacitors are measured with the compensating elements and are modified so as to modify the oscillation of the resonator.

Piezoelectric transducers

Inertial sensors using piezoelectric transducers

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Winchester, MA, United States of America

William Albert Clark