Ansys, Inc.

William Alan Mullen

John Lee

Scott Johnson

Altan Odabasi

Murat Becer

Aveek Sarkar

Norman H Chang

Deqi Zhu

Yu Lu

Wei Zhou

Kunhua Ma

Prabhas Ranjan Kumar

Circuit design techniques can use a trained predictor to predict key dynamic current metrics (such as peak current, peak time, pulse width and total charge) for a gate in a circuit library, where the predictor has been trained over different combinations of different input transition slews and different output fanout models. A dynamic current model solver can be used for a gate in the cell library to derive waveforms (of current versus time) for the different combinations, and a predictor, such as a neural network, can be trained with the outputs from the solver for the different combinations. The trained predictor can be used in a runtime simulation to solve for the dynamic current demand model of the various gates in a circuit design (such as all of the gates in an integrated circuit).

Dynamic current modeling in dynamic voltage drop analysis

A chip package system comprising N multiple processor cores can be tested by receiving a data file characterizing the chip package system. Thereafter, simulation testing is conducted for each core for each of Mstates using the data file such that each core is active in each state while all other cores are inactive. Each simulation test results in a simulation. The simulations are then combined to result in a composite test covering Mcombinations. Related apparatus, systems, techniques and articles are also described.

Integrated circuit composite test generation

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Cupertino, CA, United States of America

William Alan Mullen