Ionwerks, Inc.

Baker Hughes, a Ge Compnay, LLC

Baker Hughes Corporation

William Aaron Burton

Thomas F Egan

J Albert Schultz

Marc Gonin

Katrin Fuhrer

Steven Ulrich

Valerie E Vaughn

James G King

Edward O'Malley

Jason J Barnard

Matthew D Solfronk

Jack David Farmer

Matthew T McCoy

Edward J O'Malley

An actuation system and method, the system including a tubular having a passage, and an assembly disposed with the tubular. The assembly includes a degradable restriction, the restriction only partially blocking the passage prior to being degraded. The assembly is configured to receive and prevent further movement of a restrictor through the tubular prior to the restriction being degraded. The assembly is further configured to release the restrictor when the restriction is degraded.

Selectively degradable passage restriction

A downhole assembly includes an isolation tool disposable downhole of a perforation gun. The isolation tool includes a tubular body having a seat, and an occluding device supported on the tubular body in an unseated position, and movable to a seated position on the seat in response to at least one of a firing operation of the perforation gun and a selected fluid velocity through the isolation tool. Fluid communication through the isolation tool is allowed in uphole and downhole directions in the unseated position of the occluding device, and blocked in the downhole direction in the seated position of the occluding device.

Downhole assembly having isolation tool and method

An actuation system and method includes a tubular defining a passage, and an assembly disposed with the tubular. The assembly includes a restriction operatively arranged to receive a restrictor for enabling actuation of the assembly. The restriction includes a degradable material with a protective layer thereon, the degradable material degrading upon exposure to a fluid in the passage and the protective layer isolating the degradable material from the fluid.

Selectively degradable passage restriction and method

Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination of both methods are also disclosed.

Fast time-of-flight mass spectrometer with improved data acquisition system

Fast time-of-flight mass spectrometer with improved dynamic range

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Houston, TX, United States of America

William Aaron Burton