Dow Global Technolgoies LLC

Rohm and Haas Electronic Materials Cmp Holdings, Inc.

The Dow Chemical Company

William A Heeschen

Andrew Wank

James David Tate

Mark Gazze

Scott Chang

Jeff Tsai

Francis V Acholla

Leo H Chiang

Swee-Teng Chin

Lawrence S Hood

J Keith Harris

Richard S Harner

Stewart P Wood

Mary Beth Seasholtz

A polishing layer analyzer is provided, wherein the analyzer is configured to detect macro inhomogeneities is polymeric sheets and to classify the polymeric sheets as either acceptable or suspect.

Polishing layer analyzer and method

A method of manufacturing chemical mechanical polishing pads is provided, wherein an automated inspection system is configured to detect macro inhomogeneities is skived sheets and to classify the skived sheets as either acceptable or suspect; wherein the acceptable skived sheets are further processed to form polishing layers of chemical mechanical polishing pads.

Method of manufacturing chemical mechanical polishing pads

A chemical mechanical polishing pad, polishing layer analyzer is provided, wherein the analyzer is configured to detect macro inhomogeneities is polymeric sheets and to classify the polymeric sheets as either acceptable or suspect.

Chemical mechanical polishing pad, polishing layer analyzer and method

The present invention is directed to a method of locating leaks in a substrate () having a first and a second surface wherein the substrate () is adapted for preventing the flow of a fluid, or components contained in the fluid, through the substrate () from the first surface to the second surface, and a system () useful in the method, wherein the method comprises: a) isolating the first surface from the second surface; b) creating a pressure differential between the first surface and the second surface wherein the pressure on the first surface is higher than the pressure on the second surface; c) contacting the second surface or the exit () of the device () containing the substrate () with a baffle (), wherein the baffle () has a plurality of interconnected parts which form a pattern and the baffle () is of a sufficient size to cover the second surface of the substrate () or the fluid exit point () of the device the substrate () is disposed in and the parts of the baffle () create openings that particles () can pass through; d) exposing the surface of the baffle () to light from a source of diffuse light (); e) contacting the first side of the substrate () with a carrying fluid containing particles () of a particle size that the substrate () is a designed to retain in the first surface of the substrate (); f) monitoring the space above the surface of the baffles () for the light scattered by particles () that have passed through the substrate ().

Filter and membrane defect detection system

Prepare a polymeric foam from a foamable polymer composition containing a thermoplastic polymer composition and a blowing agent wherein 75 percent or more by weight of all non-halogenated polymers in the foamable polymer composition is a styrene-acrylonitrile copolymer composition having a polymerized acrylonitrile content distribution with a positive skew in a copolymerized AN content distribution and a positive percent difference between the mean and the median copolymerized AN content distribution.

Positive skew styrene-acrylonitrile copolymer foam

The present invention relates to a turbidity calibration standard comprising: a number of from 1 to 5 sequentially-interfaced layers, wherein each layer independently comprises a light-permeable polymer or light-permeable interpolymer; a measured light transmission modulating amount of at least one light transmission modulator, which is distributed in any one or more of the layers; and a light-permeable container, which contains the layers and the at least one light transmission modulator. Also, the invention relates to methods of making and using the standard, and kits comprising the standard.

Stable turbidity calibration standards

The presence and concentration of an optically active constituent of a fluid medium is determined in-situ by immersing in the fluid medium a probe constructed to pass plane polarized light through the fluid medium in first and second passes so as to induce an optical rotation to the plane of polarization. The light is analyzed after the second pass in a manner to provide a plurality of light components whose individual intensities are affected by the induced optical rotation. A light intensity ratio is determined for the individual light components and compared to light intensity ratios obtained from like fluid media having known concentrations of the optically active constituent therein to permit determination of the concentration of the optically active constituent.

Growing community of inventors

Midland, MI, United States of America

William A Heeschen