Becton Dickinson and Company Limited

Willem Stokdijk

Valdis Janis Riekstins

Sreedhar Payavala

Dwayne Yount

C Brent Harrison

Perry Hopkins

Scott Brown

Andrew Lister

Steven Helms

Provided herein are systems and methods for improving yield of sorted particles. In one embodiment, for example, there is provided a system including: (a) a flow cytometer to analyze a sample, wherein the flow cytometer provides a parameter plot based on the analysis of the sample; (b) a user-interface, wherein a user can define a coincidence acceptance gate in the parameter plot, and wherein the coincidence acceptance gate identities a non-target particle population in the sample that may be accepted with a target particle in a subsequent sort analysis; and (c) a sort analysis system to sort particles within the sample, while accepting particles defined by coincidence acceptance gate.

System and method to improve yield of sorted particles

A system and method for use with a flow cytometer to improve event reading and data processing capabilities of the flow cytometer, while also providing efficient system configuration assessment capabilities. The system and method enables the flow cytometer to capture and sample an entire waveform representative of an event being read, and provides improved processing and analysis of the sampled data in a real time or near real-time basis. The system and method further enable the flow cytometer to assess its configuration and provide assessment results to an operator in an efficient and effective manner.

System and method for providing improved event reading and data processing capabilities in a flow cytometer

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Seattle, WA, United States of America

Willem Stokdijk