Isorg

Commissariat &#xc0; L'&#xc9;nergie Atomique Et Aux &#xc9;nergies Alternatives

Centre National De La Recherche Scientifique

Université Joseph Fourier

Wilfrid Schwartz

Benjamin Bouthinon

Quentin Chable

Agathe Puszka

Cédric Ducros

Alessandro Siria

Alexandre Pereira

Serge Huant

Joël Chevrier

Pierre Muller

An infrared photodetector including a stack of layers on a substrate having an active area made of organic semiconductor materials capable of converting an infrared radiation into an electric signal and including, in said stack and/or on the substrate, a single layer at least partially filtering visible light.

Infrared photodetector

An image acquisition system includes a source of a radiation, an image sensor including an array of photodetectors capable of detecting the radiation and including a surface, and an angular filter, covering the sensor, and capable of blocking the rays of the radiation having an incidence relative to a direction orthogonal to the surface greater than a threshold and of giving way to at least certain rays of the radiation having an incidence relative to a direction orthogonal to the surface smaller than the threshold.

Image acquisition system

A display and detection system including an image sensor, a display screen and an antireflection system covering the display screen and the image sensor, such an antireflection system including an electrically-controllable rectilinear polarizer.

Display and detection system

The instant disclosure describes an optical device for the interferometric analysis of the surface condition of an object, including: a light source; an optical fiber capable of receiving the incident light wave and transmitting said wave to the object; a detector capable of detecting a combination between a light wave reflected by the optical fiber and a light wave returned by the object; and in which the optical fiber has a free end in the shape of a cone, with a vertex angle of between 15 and 25 degrees, the tip of the cone having dimensions of less than 50&#xd7;50 nm, and the tip of the cone being placed, while in use, at a distance of between 5 and 50 &#x3bc;m from the surface of the object.

Use of an optical device for interferometric analysis of the surface condition of an object

Growing community of inventors

Grenoble, France

Wilfrid Schwartz