The Boeing Company

Wes Quigley

Paul Griffin Vahey

Paul H Shelley, Jr

Gregory James Werner

Greg Werner

Paul Shelley

Paul H Shelley

A method for fabricating thermal effect standards includes providing an oven, placing at least one temperature sensor at measurement location in the oven, operating the oven, monitoring a temperature output of the at least one temperature sensor, providing at least one composite material specimen, placing the at least one composite material specimen at the measurement location in the oven and heat treating the at least one composite material specimen as at least one thermal effect standard by operating the oven according to the temperature output of the at least one temperature sensor. A method of determining a physical property of a composite material is also disclosed.

Method for fabricating thermal effect standards

A system and method for measuring coating thickness upon a substrate containing directionally oriented elements is disclosed. A near infrared light is directed upon the coating and reflected near infrared light is collected to determine the coating thickness. A pair of stacked and crossed diffuser elements is placed between the light source and the sample, and between the sample and the reflected near infrared light collector to improve the accuracy of the measurement, especially for coating thickness of less than about 2 mils and for coatings on substrates containing directionally oriented components. Each diffuser element is formed of a polytetrafluoroethylene fluoropolymer (PTFE) film.

Application of crossed teflon diffuser to coatings on oriented surfaces

The the thickness of an opaque coating may be measured using near-infrared absorbance. One measurement method includes transmitting the near-infrared radiation towards the opaque material and determining relative absorbance levels over a range of near-infrared wavelengths. Absorbance wavelengths having relatively high absorbance and relatively low absorbance are then identified and selected. The selected wavelength values are then correlated with known material thicknesses.

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Auburn, WA, United States of America

Wes Quigley