Rohde and Schwarz Gmbh & Co. Kg

Werner Held

Martin Leibfritz

Jan-Patrick Schultheis

Jakob Hammer

Florian Ramian

Thomas Kuhwald

Johannes Steffens

Thilo Bednorz

Maximilian Friesinger

Marcel Ruf

Christian Kuhn

Walter Weiss

An automated calibration unit has several ports for connecting with respective ports of a test and measurement instrument to be calibrated. The automated calibration unit has a frequency conversion circuit that is non-linear and reciprocal in amplitude and phase. The automated calibration unit has at least one switching circuit with several switch states. The automated calibration unit is configured to selectively connect each one of the several ports to another one of the several ports depending on the switch state, thereby providing a through connection via the frequency conversion circuit. The automated calibration unit is configured to selectively connect each one of the several ports to at least one of several calibration standards respectively depending on the switch state. Further, a frequency conversion circuit and a method of performing calibration of a test and measurement instrument are described. Moreover, a method of absolute power calibration transfer is described.

Automated calibration unit, frequency conversion circuit and method of performing calibration of a test and measurement instrument

A test system for testing a device under test having at least an input port and an output port. The test system comprising a vector signal generator, a switch, a directional element, and a vector signal analyser. The vector signal generator, depending on the respective switching position of the switch, is connected with the input port of the device under test or the output port of the device under test such that, in a first switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the input port and, in a second switching position of the switch, the wideband modulated signal generated by the vector signal generator is forwarded to the output port. The switch is configured to enable the vector signal analyser to perform reflection measurements and transmission measurements depending on the respective switching position of the switch.

Test system

A method of calibrating a setup comprises: performing at least one calibration of the setup, thereby obtaining calibration data; setting a quantity representing forward tracking to be equal with a quantity representing reverse tracking; solving a system of equations having at least an unknown quantity representing the forward tracking or the reverse tracking, thereby obtaining at least one equation having the unknown quantity squared; creating based on the calibration data obtained two phase over frequency relationships for the respective quantity; determining two lines having a linear change in phase over frequency for the phase over frequency relationships created; extrapolating the lines determined to a frequency of 0 Hz; and determining the respective quantity by selecting one line of the lines extrapolated that is closer to a phase of zero, 2&#x3c0; or a multiple thereof at the frequency of 0 Hz.

Method of calibrating a setup

A measurement system for determining a phase and amplitude influence of a device under test, comprising a measurement instrument having a signal generator, a local oscillator, a first mixer and an analysis unit is disclosed. The signal generator is configured to generate a source signal with a predetermined source frequency and a source phase, and to forward the source signal to the device under test, wherein the source signal is altered by the device under test in at least one of amplitude and phase, such that a measurement signal is generated and forwarded to the first mixer. The local oscillator is configured to generate a local oscillator signal with a predetermined local oscillator frequency and a local oscillator phase, and to forward the local oscillator signal to the first mixer. The first mixer is configured to mix the measurement signal and the local oscillator signal, thereby generating a first mixer signal. The analysis unit is located downstream of the first mixer and is configured to analyze the first mixer signal or a processed version of the first mixer signal. The measurement instrument is configured to perform at least two measurements of the phase and amplitude influence of the device under test by analyzing the first mixer signal or the processed version of the first mixer signal, wherein at least one of the source phase and the local oscillator phase is altered between the at least two measurements.

Measurement system and method for determining a phase and amplitude influence of a device under test

A method of absolute phase calibration of at least a first port of a test and measurement equipment, comprising: providing the test and measurement equipment having the first port to be calibrated; providing a calibration mixer having a first port, a second port and a local oscillator port; providing at least one phase reproducible source that outputs a local oscillator signal; and performing at least two UOSM measurements at the first port of the test and measurement equipment, wherein at least one of the at least two UOSM measurements is performed with a frequency shift from a first frequency to a second frequency by using the calibration mixer. Furthermore, a calibration system is described.

Method of absolute phase calibration as well as calibration system

A method of setting an analyzer, the method comprising: providing an analyzer with a first signal source and a second signal source; connecting the signal sources with a device under test; generating a first signal, transmitting the first signal to the device under test, measuring the first transmitted signal and a first signal reflected from the device under test, thereby obtaining first compensation parameters; generating a second signal, transmitting the second signal to the device under test, measuring the second transmitted signal and a second signal reflected from the device under test, thereby obtaining second compensation parameters; using the first and second compensation parameters to compensate the signal sources; and transmitting the first and second signals simultaneously.

Method of setting an analyzer for testing a device under test

A method of calibrating a measurement and analyzing device for measuring a frequency-converting device under test, comprises the steps of connecting a first port of the measurement and analyzing device with a radio frequency port assigned to the frequency-converting device under test as well as connecting a second port of the measurement and analyzing device with an intermediate frequency port assigned to the frequency-converting device under test. Further, a scalar-mixer calibration is performed at the radio frequency port and the intermediate frequency port, thus providing a precise calibration conversion amplitude. A relative calibration is performed between the radio frequency port and the intermediate frequency port by using a calibration mixer. At least one correction coefficient is determined by the difference between the results obtained from the scalar-mixer calibration and the relative calibration. The at least one correction coefficient is used to correct an error term applied.

Method of calibrating a measurement and analyzing device as well as method of measuring a frequency-converting device under test

A signal source is described. The signal source comprises a signal generator, a first frequency divider and a second frequency divider. The first and the second frequency divider are each connected to the signal generator. The signal generator is configured to generate a source signal having a source frequency and to selectively forward the source signal to at least one of the first frequency divider and the second frequency divider. The first frequency divider is established as an integer frequency divider and is configured to generate a first output signal from the source signal. The second frequency divider is different from the first frequency divider and is configured to generate a second output signal from the source signal, wherein a phase noise of the second output signal is considerably lower than a phase noise of the first output signal. Moreover, a test system and a method for testing a device under test are described.

Signal source, test system and method for testing a device under test

A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.

Method of measuring the AM/PM conversion of a device under test

A vector network analyzer for obtaining at least one wave frequency ratio with respect to a frequency-converting device under test is provided. The vector network analyzer comprises a transmitter side configured to be controlled by at least one transmitter side clock signal, a receiver side configured to be controlled by at least one receiver side clock signal, and a central clock configured to generate a central clock signal. The at least one transmitter side clock signal and the at least one receiver side clock signal are based on the central clock signal, the at least one transmitter side clock signal and the at least one receiver side clock signal are generated with a fixed phase relation to each other with the aid of a start pulse.

Vector network analyzer and measuring method for frequency-converting measurements

A measurement apparatus () comprising a high frequency measurement unit () adapted to measure high frequency parameters (HFP) of a device under test (DUT) connected to ports of said measurement apparatus () and a multimeter unit () adapted to measure DC characteristics parameters (DCP) of said device under test (DUT) connected via control signal lines (CL) to a control bus interface () of said measurement apparatus ().

Measurement apparatus

A test device for testing an electronic device under test comprises a remote measurement module configured to capture signals originating from the electronic device under test and output the captured signals, and an analysis device configured to receive the captured signals and to calibrate the test device based on test signals provided by the analysis device and the captured signals.

Test device, remote measurement module and test method

A method for measuring group delay on a device under test is described, wherein a test signal with a carrier frequency is generated. An amplitude modulation is applied to said test signal in order to generate at least two group delay signals having frequencies that are symmetrical to the frequency of said test signal. At least said group delay signals are provided to said device under test. Further, a measurement device and a measurement system are described.

Method for measuring group delay on a device under test, measurement device as well as measurement system

A measurement bridge, in particular for a network analyzer, including a reference port, a central output port and a balun having a first balun input connector and a first and a second balun output connector. The first balun output connector is connected to a first signal path and the second balun output connector is connected to a second signal path. The central output port is connected to the first signal path, and the reference port is connected to the second signal path. The electrical parameters of the first signal path and the second signal path are approximately the same.

Measurement bridge in a printed circuit board

A network analyzer contains a processing device, at least one signal generator and at least four measuring points. The processing device controls the signal generator and processes measured values picked up from the measuring points. The network analyzer implements several calibration measurements on calibration standards, before it implements measurements on a device under test. The network analyzer implements the calibration measurements using the measuring points. The processing device determines error matrices on the basis of the results of the calibration measurements. The network analyzer implements measurements on the device using simultaneously, exactly three measuring points. The processing device determines measured values in each case of a fourth measuring point on the basis of the calibration measurements and the measured values of the three measuring points. The three measuring points belong to the set of the at least four measuring points, at which the network analyzer implements the calibration measurements.

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Pocking, Germany

Werner Held