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Bam Bundesanstalt Fur Materialforschung Und-prufung

Bundesanstalt Fur Materialforschung Und -prufung (bam)

Werner Heinrich

Joachim W Baumann

Karsten Kolk

Matthias Goldammer

Hubert Mooshofer

Ludwig Bär

Juergen Peifer

Hans-Peter Lohmann

Claus Ahlers

Gerhard Walter

Rainer Böhm

Georg Diessl

Karl Fendt

Rainer Boehm

Uwe BÜCHNER

A method and a device for defect-size evaluation of defects in a test object in ultrasonic testing is provided. In particular, the method and device also allows systematic determination of defect sizes based on the SAFT method. This is done by simulating defects in a test object on the basis of a defined test scenario, and comparing these simulations with actually recorded measured values.

Method and device for defect-size evaluation

A device and a method for detecting at least one defect in a test object (). At least one test head () radiates an ultrasonic signal at different measuring points (MP) into the test object () with each point at an insonation or radiation angle (&#x3b1;) in order to ascertain multiple measurement data sets (MDS). The angle is constant for each data set (MDS). An analyzing unit () carries out an SAFT (Synthetic Aperture Focusing Technique) analysis for each ascertained measurement data set (MDS) using a common reconstruction grid (RG) inside the test object () in order to calculate an SAFT analysis result for each measurement data set (MDS). The analyzing unit () superimposes the calculated SAFT analysis results in order to calculate an orientation-independent defect display value (S) for each reconstruction point (RP) of the common reconstruction grid (RG).

Method and device for detecting defects within a test object

A technique is provided for determining an orientation of a defect present within a mechanical component using at least one ultrasonic head that applies ultrasonic signals to the mechanical component starting from various measurement points. Echo ultrasonic signals reflected by a point to be analyzed present within the component back to the measurement points are received by the same or a different ultrasonic head. A data processing unit analyzes the received echo ultrasonic signals as a function of a sound emission direction between each measurement ping and the point to be analyzed for determining the orientation of the defect. A distance between the measurement point and the point to be analyzed is calculated for every measurement point as a function of a signal propagation time between the point in time of emitting the ultrasonic signal and the point in time of receiving the echo ultrasonic signal reflected by a defect.

Method and device for determining an orientation of a defect present within a mechanical component

A method for the non-destructive material testing of a test object at least solid in some regions by subjecting the test object to ultrasonic waves and capturing the ultrasonic waves reflected within the test object. The method includes the steps, computer-supported dividing of the test object into a prescribed number of volume elements, subjecting the test object to ultrasound on a plurality of surface elements while probing the surface or at least one surface segment of the test object, capturing the sound waves reflected at the volume element while probing the plurality of surface elements on the surface or at least the surface segment of the test object, and in-phase addition of the sound waves reflected at the same volume elements and captured at various surface elements of the surface of the test object. Angle-dependent amplitude distribution is used in the sound field of the test head.

Method and device for non-destructive material testing of a test object using ultrasonic waves

A method for determining parameters of a component using thermography, where at least one component is heated by a hot gas, is provided. Also provided is a device for determining component parameters using thermography, including a device for heating at least one component and a temperature sensor for detecting at least one temperature value of the component, wherein the device for heating the component is a hot gas emission device for the emission of a modulated, mostly pulsed, hot gas.

Method and apparatus for determining component parameters by means of thermography

The invention relates to a probe for electrical measurements and use of a flexible probe to produce an inflexible probe. Conventional probes comprise a substrate which is mechanically rigid. As a result only planar surfaces may be examined with the probe. According to the invention, a probe is flexibly embodied by means of a flexible substrate such that the probe may be adjusted to match various curvature radii of test bodies.

Probe for electrical measurement methods and use of a flexible probe for production of a rigid probe

When using a rigid substrate eddy current probe to measure a non-planer test piece, the probe must be adapted to the test piece shape in order to avoid incorrect measurement values. Disclosed is a probe which is configured in a flexible manner via a flexible substrate so as to be adjustable to different radii of curvature of a test piece. Furthermore the probe lining is also embodied in an elastic manner.

Probe for electrical measurement methods, especially eddy current measurements

A method for converting data formats which differ from one another during exchange of messages or data between programs running on different processors of a communication system provides that a conversion procedure is generated per each data type during the translation event of the source programs and that the conversion procedure which controls the conversion of the data formats is called during the later running of the processes and programs immediately before a message exchange.

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Oberkrämer OT Bärenklau, Germany

Werner Heinrich