Micro-epsilon Messtechnik Gmbh & Co. Kg

Siemens Aktiengesellschaft

Werner Grömmer

Felix Mednikov

Martin Sellen

Benno Weis

Robert Schmid

Stanislav Medinkov

Mark Netchaewskij

In one embodiment, a method for determining the distance of a conducting surface profiled in a direction of distance determination from a functional surface moving relative to the profiled surface is disclosed. The method includes connecting inputs of a sensor to an oscillator arrangement. The sensor includes a first and a second measuring coil. The method includes further connecting outputs of the sensor to an analog-to-digital converter via a demodulator unit to obtain first and second digital measured values. The first and second digital measured values correspond to the distance between the profiled surface and the first and second measuring coil of the sensor, respectively. The method further includes connecting an arithmetic unit to the analog converter unit. The second measurement coil is arranged at a known distance from the first measuring coil on the side of the first measuring coil that faces away from the profiled surface. The method finally includes calculating, using the first and second digital measured value and a reference digital value and the fixed distance, a distance measured value giving the distance of the functional surface from the profiled surface. The reference digital value corresponding to the measured value from a reference coil. The reference coil is assigned to the first and second measuring coils and the reference coil is located outside the range of influence of the profiled surface.

Method and system for determining the distance between a profiled surface and a functional surface moving in relation thereto by using measurement coils and a reference coil

A method and a device for determining motion parameters of a conductive, profiled surface () relative to a sensor (), with the sensor () comprising at least one coil for generating an electromagnetic alternating field, which is subjected, because of the feedback resulting from position changes between the surface () and the sensor (), to a variation, which is determined by means of the coil (). The position change is derived from the coupling impedance (Z) of the coil (), and the real component (R) and the imaginary component (X) of the complex coupling impedance (Z) of the coil () are determined, with a distance d between the sensor () and the surface () being computed based on the determined values while using an algorithm as a basis.

Method and device for determining motion parameters of a conductive, profiled surface

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Munich, Georgia

Werner Grömmer