Tsinghua University

Union Strong (beijing) Technology Co. Ltd.

Wenzhi Wang

Wei Zhao

Songling Huang

Shen Wang

Lisha Peng

Zijing Huang

Xue Feng

Ling Song

Guangming Yang

Lan Qin

Xiaochun Song

A method and a system for measuring morphological parameters of an intracranial aneurysm image, the method comprises: segmenting an intracranial parent artery image from three-dimensional DICOM data of DSA (S); segmenting the intracranial aneurysm image on the intracranial aneurysm image (S); and measuring morphological parameters of the intracranial aneurysm image (S). The method and the system for measuring the morphological parameters of the intracranial aneurysm image as disclosed may implement automated measurement of the intracranial aneurysm image, quickly measure morphological parameters of the intracranial aneurysm image, and guarantee consistency between measurements of morphological parameters of the aneurysm image.

Method and system for measuring morphological parameters of an intracranial aneurysm image

A device and a method for testing a steel defect based on internal and external magnetic perturbation. The device includes: a magnetizer comprising a magnetization source and a magnet yoke, arranged on a surface of a sample, and configured to generate two types of typical magnetic field regions applied to testing based on internal and external magnetic perturbation; a double-row magnetic sensor probe, configured to collect internal and external magnetic perturbation data; a master controller, configured to perform pre-processing on the internal and external magnetic perturbation data, and store the pre-processed data; scanner wheels, configured to generate a sampling trigger pulse during scanning to enable the master controller to receive the internal and external magnetic perturbation data from the probes; and a host computer, configured to analyze the pre-processed data uploaded by the master controller to obtain a defect quantitative result.

Device and method for testing steel defect based on internal and external magnetic perturbation

A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.

Device and method for detecting defect contour with omnidirectionally equal sensitivity based on magnetic excitation

Growing community of inventors

Beijing, China

Wenzhi Wang